We report electrical spin injection from a ferromagnetic metal contact into a semiconductor light emitting diode structure with an injection efficiency of 30% which persists to room temperature. The Schottky barrier formed at the Fe/AlGaAs interface provides a natural tunnel barrier for injection of spin polarized electrons under reverse bias. These carriers radiatively recombine, emitting circularly polarized light, and the quantum selection rules relating the optical and carrier spin polarizations provide a quantitative, model-independent measure of injection efficiency. This demonstrates that spin injecting contacts can be formed using a widely employed contact methodology, providing a ready pathway for the integration of spin transport into semiconductor processing technology.
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18 February 2002
Research Article|
February 18 2002
Efficient electrical spin injection from a magnetic metal/tunnel barrier contact into a semiconductor Available to Purchase
A. T. Hanbicki;
A. T. Hanbicki
Materials Physics Branch, Naval Research Laboratory, Washington, DC 20375
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B. T. Jonker;
B. T. Jonker
Materials Physics Branch, Naval Research Laboratory, Washington, DC 20375
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G. Itskos;
G. Itskos
Department of Physics, State University of New York, Buffalo, New York 14260
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G. Kioseoglou;
G. Kioseoglou
Department of Physics, State University of New York, Buffalo, New York 14260
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A. Petrou
A. Petrou
Department of Physics, State University of New York, Buffalo, New York 14260
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A. T. Hanbicki
B. T. Jonker
G. Itskos
G. Kioseoglou
A. Petrou
Materials Physics Branch, Naval Research Laboratory, Washington, DC 20375
Appl. Phys. Lett. 80, 1240–1242 (2002)
Article history
Received:
October 04 2001
Accepted:
December 18 2001
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Comment on “Efficient electrical spin injection from a magnetic metal/tunnel barrier contact into a semiconductor” [Appl. Phys. Lett. 80, 1240 (2002)]
Citation
A. T. Hanbicki, B. T. Jonker, G. Itskos, G. Kioseoglou, A. Petrou; Efficient electrical spin injection from a magnetic metal/tunnel barrier contact into a semiconductor. Appl. Phys. Lett. 18 February 2002; 80 (7): 1240–1242. https://doi.org/10.1063/1.1449530
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