Focused-electron-beam-deposited carbon atomic-force microscope tips were characterized using flexural vibrations excited with piezoelectric transducers and observed directly inside a scanning electron microscope. Frequencies in the high-MHz range were measured and the elastic modulus was estimated to be 0.54±0.16 TPa.

Topics
Transducers, Elastic modulus, Mechanical properties, Atomic force microscopy, Scanning electron microscopy, Electron beams
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