The effect of the III/V ratio and growth temperature on the In incorporation has been studied in thick (>300 nm) InGaN layers, with In mole fractions from 19% to 37%, grown by molecular-beam epitaxy on sapphire and on GaN templates. Significant desorption of In occurs at growth temperatures above 550 °C. Symmetric and asymmetric reflections from high resolution X-ray diffraction reveals that the layers are not fully relaxed. A bowing parameter of 3.6 eV is calculated from optical absorption data, once corrected for strain-free band gap values. The increase of both, the absorption band-edge broadening and the photoluminescence full width at half maximum at room temperature with the In content, is discussed in terms of a strong In localization effect. This localization effect is further evidenced by the S-shaped temperature dependence of the emission energy.
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14 January 2002
Research Article|
January 14 2002
Strong localization in InGaN layers with high In content grown by molecular-beam epitaxy Available to Purchase
F. B. Naranjo;
F. B. Naranjo
ISOM and Departamento de Ingenierı́a Electrónica, ETSI Telecomunicación, Universidad Politécnica de Madrid, Ciudad Universitaria, 28040 Madrid, Spain
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M. A. Sánchez-Garcı́a;
M. A. Sánchez-Garcı́a
ISOM and Departamento de Ingenierı́a Electrónica, ETSI Telecomunicación, Universidad Politécnica de Madrid, Ciudad Universitaria, 28040 Madrid, Spain
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F. Calle;
F. Calle
ISOM and Departamento de Ingenierı́a Electrónica, ETSI Telecomunicación, Universidad Politécnica de Madrid, Ciudad Universitaria, 28040 Madrid, Spain
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E. Calleja;
E. Calleja
ISOM and Departamento de Ingenierı́a Electrónica, ETSI Telecomunicación, Universidad Politécnica de Madrid, Ciudad Universitaria, 28040 Madrid, Spain
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B. Jenichen;
B. Jenichen
Paul-Drude-Institut fuer Festkoerperelektronik, Hausvogteiplatz 5-7, D-10117 Berlin, Germany
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K. H. Ploog
K. H. Ploog
Paul-Drude-Institut fuer Festkoerperelektronik, Hausvogteiplatz 5-7, D-10117 Berlin, Germany
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F. B. Naranjo
ISOM and Departamento de Ingenierı́a Electrónica, ETSI Telecomunicación, Universidad Politécnica de Madrid, Ciudad Universitaria, 28040 Madrid, Spain
M. A. Sánchez-Garcı́a
ISOM and Departamento de Ingenierı́a Electrónica, ETSI Telecomunicación, Universidad Politécnica de Madrid, Ciudad Universitaria, 28040 Madrid, Spain
F. Calle
ISOM and Departamento de Ingenierı́a Electrónica, ETSI Telecomunicación, Universidad Politécnica de Madrid, Ciudad Universitaria, 28040 Madrid, Spain
E. Calleja
ISOM and Departamento de Ingenierı́a Electrónica, ETSI Telecomunicación, Universidad Politécnica de Madrid, Ciudad Universitaria, 28040 Madrid, Spain
B. Jenichen
Paul-Drude-Institut fuer Festkoerperelektronik, Hausvogteiplatz 5-7, D-10117 Berlin, Germany
K. H. Ploog
Paul-Drude-Institut fuer Festkoerperelektronik, Hausvogteiplatz 5-7, D-10117 Berlin, Germany
Appl. Phys. Lett. 80, 231–233 (2002)
Article history
Received:
July 30 2001
Accepted:
November 13 2001
Citation
F. B. Naranjo, M. A. Sánchez-Garcı́a, F. Calle, E. Calleja, B. Jenichen, K. H. Ploog; Strong localization in InGaN layers with high In content grown by molecular-beam epitaxy. Appl. Phys. Lett. 14 January 2002; 80 (2): 231–233. https://doi.org/10.1063/1.1432751
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