In this letter, we report on a material deposition scheme for quaternary layers using a pulsed atomic layer epitaxy (PALE) technique. The PALE approach allows accurate control of the quaternary layer composition and thickness by simply changing the number of aluminum, indium, and gallium pulses in a unit cell and the number of unit cell repeats. Using PALE, AlInGaN layers with Al mole fractions in excess of 40% and strong room-temperature photoluminescence peaks at 280 nm can easily be grown even at temperatures lower than 800 °C.
Pulsed atomic layer epitaxy of quaternary AlInGaN layers
J. Zhang, E. Kuokstis, Q. Fareed, H. Wang, J. Yang, G. Simin, M. Asif Khan, R. Gaska, M. Shur; Pulsed atomic layer epitaxy of quaternary AlInGaN layers. Appl. Phys. Lett. 13 August 2001; 79 (7): 925–927. https://doi.org/10.1063/1.1392301
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