We have investigated the transport and noise properties of submicron bicrystal grain-boundary junctions prepared using electron beam lithography. The junctions show an increased conductance for low voltages reminiscent of Josephson junctions having a barrier with high transmissivity. The voltage noise spectra are dominated by a few Lorentzian components. At low temperatures clear two-level random telegraph switching signals are observable in the voltage versus time traces. We have investigated the temperature and voltage dependence of individual fluctuators both from statistical analysis of voltage versus time traces and from fits to noise spectra. A transition from tunneling to thermally activated behavior of individual fluctuators was clearly observed. The experimental results support the model of charge carrier traps in the barrier region.
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12 February 2001
Research Article|
February 12 2001
Transport and noise characteristics of submicron high-temperature superconductor grain-boundary junctions
F. Herbstritt;
F. Herbstritt
II. Physikalisches Institut, Universität zu Köln, Zülpicherstrasse 77, D-50937 Köln, Germany
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T. Kemen;
T. Kemen
II. Physikalisches Institut, Universität zu Köln, Zülpicherstrasse 77, D-50937 Köln, Germany
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L. Alff;
L. Alff
II. Physikalisches Institut, Universität zu Köln, Zülpicherstrasse 77, D-50937 Köln, Germany
Walther-Meissner-Institut für Tieftemperaturforschung, Walther-Meissner Strasse 8, D-85748 Garching, Germany
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A. Marx;
A. Marx
II. Physikalisches Institut, Universität zu Köln, Zülpicherstrasse 77, D-50937 Köln, Germany
Walther-Meissner-Institut für Tieftemperaturforschung, Walther-Meissner Strasse 8, D-85748 Garching, Germany
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R. Gross
R. Gross
II. Physikalisches Institut, Universität zu Köln, Zülpicherstrasse 77, D-50937 Köln, Germany
Walther-Meissner-Institut für Tieftemperaturforschung, Walther-Meissner Strasse 8, D-85748 Garching, Germany
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F. Herbstritt
T. Kemen
L. Alff
,
A. Marx
,
R. Gross
,
II. Physikalisches Institut, Universität zu Köln, Zülpicherstrasse 77, D-50937 Köln, Germany
Appl. Phys. Lett. 78, 955–957 (2001)
Article history
Received:
September 27 2000
Accepted:
December 05 2000
Citation
F. Herbstritt, T. Kemen, L. Alff, A. Marx, R. Gross; Transport and noise characteristics of submicron high-temperature superconductor grain-boundary junctions. Appl. Phys. Lett. 12 February 2001; 78 (7): 955–957. https://doi.org/10.1063/1.1343847
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