Transverse spin lifetimes of spin-polarized photogenerated carriers in InAs self-assembled quantum dots are extracted from the depolarization of their photoluminescence in a magnetic field perpendicular to the spin (the Hanle effect). Hanle measurements on a series of samples reveal that the dot dimensions influence the spin lifetime and its dependence on temperature. The spin lifetime as a function of excitation intensity is qualitatively distinct for carrier spins created in the GaAs host as compared to in the InAs wetting layer.

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All data shown were taken with pulsed excitation [pulse full width at half maximum ∼10 meV, 100 fs] due to the greater power stability of the laser mode locked. In measurements with cw excitation at the WL (not shown), the Hanle curve has the same qualitative shape but a ∼10% increase in gT2* for the same average intensity as the pulsed case. The form of ρ(B) is unchanged from Eq. (1) with pulsed excitation when, as in our case, T2*≪τL, where τL(=13 ns) is the time between pulses.
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