Multilayer ferroelectric and ferromagnetic thin films were fabricated with the following composition and structure: and (PLCT/LSMO), with an intention of creating a device of new concept. The films were fabricated using metalorganic deposition. The LSMO/PLCT structured films exhibit the ferroelectric properties while the PLCT/LSMO structured films exhibit the ferromagnetic properties. Compared with the PLCT/Pt structure, the capacitance-frequency and tan δ-frequency properties of the LSMO/PLCT structure are degraded. The magnetoresistance of the PLCT/LSMO structure was measured and the results show that the metal-insulator transition temperature is lower than that of the structure. Furthermore, the magnetoresistance at 77 K and at the transition temperature for the PLCT/LSMO structure is higher than that of the structure. These effects can be explained by the piezoelectricity of the PLCT film deposited on the LSMO layer. In addition, these effects demonstrate that the ferromagnetic properties can be controlled by the ferroelectric properties of the multilayer films.
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11 June 2001
Research Article|
June 11 2001
Ferroelectricity and ferromagnetism in multilayers
Jianxia Gao;
Jianxia Gao
CMMS Center, School of Mechanical and Production Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore
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Xiangrong Zhu;
Xiangrong Zhu
Shanghai Institute of Metallurgy, The Chinese Academy of Sciences, Shanghai 200050, People’s Republic of China
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Weili Liu;
Weili Liu
Shanghai Institute of Metallurgy, The Chinese Academy of Sciences, Shanghai 200050, People’s Republic of China
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Zhibin Zhang;
Zhibin Zhang
Laboratory of Nuclear Analysis Techniques, Shanghai Institute of Nuclear Research, The Chinese Academy of Sciences, Shanghai 201800, People’s Republic of China
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Jianqing Cao;
Jianqing Cao
Laboratory of Nuclear Analysis Techniques, Shanghai Institute of Nuclear Research, The Chinese Academy of Sciences, Shanghai 201800, People’s Republic of China
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Chenglu Lin;
Chenglu Lin
Shanghai Institute of Metallurgy, The Chinese Academy of Sciences, Shanghai 200050, People’s Republic of China
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Dezhang Zhu;
Dezhang Zhu
Laboratory of Nuclear Analysis Techniques, Shanghai Institute of Nuclear Research, The Chinese Academy of Sciences, Shanghai 201800, People’s Republic of China
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E. Liu
E. Liu
CMMS Center, School of Mechanical and Production Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore
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Appl. Phys. Lett. 78, 3869–3871 (2001)
Article history
Received:
October 16 2000
Accepted:
April 20 2001
Citation
Jianxia Gao, Xiangrong Zhu, Weili Liu, Zhibin Zhang, Jianqing Cao, Chenglu Lin, Dezhang Zhu, E. Liu; Ferroelectricity and ferromagnetism in multilayers. Appl. Phys. Lett. 11 June 2001; 78 (24): 3869–3871. https://doi.org/10.1063/1.1378314
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