Orthorhombic epitaxial thin-film phosphors were grown on (100) and yttria-stabilized-zirconia (YSZ) single crystal substrates with epitaxial relationships of (100) and respectively. As-deposited films exhibit a broadband photoluminescence (PL) emission, peaking at about 477–481 nm with a maximum cathodoluminescence (CL) intensity at about 465 nm. Enhanced PL intensity was observed for the films deposited on (100) YSZ and substrates as compared to deposits on -plane sapphire substrates, correlating with improved intragranular crystallinity and reducing defects via epitaxy. Postannealing in air significantly enhanced both of the PL and CL intensities. Luminous efficiency of 0.14 lm/W at 1 kV and 22 was observed for a 2-μm-thick film annealed at 1000 °C in air.
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31 July 2000
Research Article|
July 31 2000
Photo- and cathodoluminescence characteristics of blue-light-emitting epitaxial thin-film phosphors
Yong Eui Lee;
Yong Eui Lee
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056
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David P. Norton;
David P. Norton
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056
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John D. Budai;
John D. Budai
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056
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Philip D. Rack;
Philip D. Rack
Advanced Vision Technologies, Inc., West Henrietta, New York 14586
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Michael D. Potter
Michael D. Potter
Advanced Vision Technologies, Inc., West Henrietta, New York 14586
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Appl. Phys. Lett. 77, 678–680 (2000)
Article history
Received:
December 13 1999
Accepted:
May 10 2000
Citation
Yong Eui Lee, David P. Norton, John D. Budai, Philip D. Rack, Michael D. Potter; Photo- and cathodoluminescence characteristics of blue-light-emitting epitaxial thin-film phosphors. Appl. Phys. Lett. 31 July 2000; 77 (5): 678–680. https://doi.org/10.1063/1.127083
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