The time evolution of the buildup process inside a double-barrier system for off-resonance incidence energies is studied by considering the analytic solution of the time-dependent Schrödinger equation with cutoff plane wave initial conditions. We show that the buildup process exhibits invariances under arbitrary changes on the system parameters, which can be successfully described by a simple and easy-to-use one-level formula. We find that the buildup of the off-resonant probability density is characterized by an oscillatory pattern modulated by the resonant case which governs the duration of the transient regime. This is evidence that off-resonant and resonant tunneling are two correlated processes, whose transient regime is characterized by the same transient time constant of two lifetimes.
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17 July 2000
Research Article|
July 17 2000
Dynamical analysis of the buildup process near resonance Available to Purchase
Jorge Villavicencio;
Jorge Villavicencio
Centro de Investigación Cientı́fica y de Educación Superior de Ensenada, Apartado Postal 2732, 22800 Ensenada, Baja California, México
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Roberto Romo
Roberto Romo
Facultad de Ciencias, Universidad Autónoma de Baja California, Apartado Postal 1880, 22800 Ensenada, Baja California, México
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Jorge Villavicencio
Centro de Investigación Cientı́fica y de Educación Superior de Ensenada, Apartado Postal 2732, 22800 Ensenada, Baja California, México
Roberto Romo
Facultad de Ciencias, Universidad Autónoma de Baja California, Apartado Postal 1880, 22800 Ensenada, Baja California, México
Appl. Phys. Lett. 77, 379–381 (2000)
Article history
Received:
March 14 2000
Accepted:
May 23 2000
Citation
Jorge Villavicencio, Roberto Romo; Dynamical analysis of the buildup process near resonance. Appl. Phys. Lett. 17 July 2000; 77 (3): 379–381. https://doi.org/10.1063/1.126982
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