We have studied the growth of GaInNAs by a plasma-assisted molecular-beam epitaxy (MBE). It was found that the N-radicals were incorporated into the epitaxial layer like dopant atoms. In the range of 400–500 °C, the growth temperature mainly affected the crystal quality of GaInNAs rather than the N concentration. The N concentration dropped rapidly when exceeded 500 °C. Considering N desorption alone is insufficient to account for the strong falloff of the N concentration with over 500 °C, the effect of thermally-activated N surface segregation must be taken into account. The N concentration was independent of the arsenic pressure and the In concentration in GaInNAs layers, but inversely proportional to the growth rate. Based on the experimental results, a kinetic model including N desorption and surface segregation was developed to analyze quantitatively the N incorporation in MBE growth.
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10 July 2000
Research Article|
July 10 2000
Kinetic modeling of N incorporation in GaInNAs growth by plasma-assisted molecular-beam epitaxy
Z. Pan;
Z. Pan
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing, 100083, Peoples Republic of China
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L. H. Li;
L. H. Li
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing, 100083, Peoples Republic of China
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W. Zhang;
W. Zhang
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing, 100083, Peoples Republic of China
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Y. W. Lin;
Y. W. Lin
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing, 100083, Peoples Republic of China
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R. H. Wu
R. H. Wu
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing, 100083, Peoples Republic of China
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Appl. Phys. Lett. 77, 214–216 (2000)
Article history
Received:
February 17 2000
Accepted:
May 18 2000
Citation
Z. Pan, L. H. Li, W. Zhang, Y. W. Lin, R. H. Wu; Kinetic modeling of N incorporation in GaInNAs growth by plasma-assisted molecular-beam epitaxy. Appl. Phys. Lett. 10 July 2000; 77 (2): 214–216. https://doi.org/10.1063/1.126928
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