A two-beam polarization interferometer in a reflection configuration is used to measure the electro-optic coefficients of highly oriented strontium barium niobate thin films prepared by a sol-gel method. The technique enables the determination of the electro-optic coefficients of films using a strong Fabry–Perot effect with automatic adjustment and maintenance of the operation point of the interferometer. The linear electro-optic coefficients increase with increasing Sr content in the films.

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