The phase-modulated beams technique is developed for nonlinear thin photorefractive films characterization. In the Raman–Nath diffraction approximation, the formulas are deduced, allowing us to measure the amplitude of phase grating recorded in a film and its nonlinear refractive index n2. The method is applied for studying Langmuir–Blodgett multilayer thin (∼0.6 μm) films of Bacteriorhodopsin at wavelength 633 nm.

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