We report detailed measurements on diode structures containing the electroluminescent polyfluorene copolymer poly(9,9-dioctylfluorene-co-bis--(4-methoxyphenyl)-bis--phenyl-1,4 phenylenediamine). Ohmic injection of holes is achieved with an oxygen plasma cleaned indium tin oxide (ITO) electrode, untreated ITO coated with a film of poly(ethylenedioxythiophene)/polystyrenesulphonic acid (PEDOT/PSS) and plasma cleaned ITO with PEDOT/PSS. Transient dark injection and time-of-flight mobility measurements and steady state current density versus voltage measurements are then entirely consistent with a positive carrier, trap-free, space-charge-limited current. Injection limited behavior is observed, however, for untreated ITO without PEDOT/PSS and for evaporated Au contacts.
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27 March 2000
Research Article|
March 27 2000
Transient and steady-state space-charge-limited currents in polyfluorene copolymer diode structures with ohmic hole injecting contacts
Alasdair J. Campbell;
Alasdair J. Campbell
Department of Physics and Astronomy, University of Sheffield, Sheffield, S3 7RH, United Kingdom
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Donal D. C. Bradley;
Donal D. C. Bradley
Department of Physics and Astronomy, University of Sheffield, Sheffield, S3 7RH, United Kingdom
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Homer Antoniadis;
Homer Antoniadis
Hewlett Packard Laboratories, Palo Alto, California 94304
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Mike Inbasekaran;
Mike Inbasekaran
Central and New Business Research and Development, The Dow Chemical Company, Midland, Michigan 48674
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Weishi W. Wu;
Weishi W. Wu
Central and New Business Research and Development, The Dow Chemical Company, Midland, Michigan 48674
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Ed P. Woo
Ed P. Woo
Central and New Business Research and Development, The Dow Chemical Company, Midland, Michigan 48674
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Appl. Phys. Lett. 76, 1734–1736 (2000)
Article history
Received:
November 23 1999
Accepted:
January 20 2000
Citation
Alasdair J. Campbell, Donal D. C. Bradley, Homer Antoniadis, Mike Inbasekaran, Weishi W. Wu, Ed P. Woo; Transient and steady-state space-charge-limited currents in polyfluorene copolymer diode structures with ohmic hole injecting contacts. Appl. Phys. Lett. 27 March 2000; 76 (13): 1734–1736. https://doi.org/10.1063/1.126182
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