Electrical failure of carbon nanotubes was investigated by obtaining I(V) data with a voltage ramp from a rope of multiwalled carbon nanotubes. Noncontact scanning force microscope images were obtained before and after each I(V) curve until electrical failure of the tube resulted. Following this procedure, it was possible to correlate a defect on the surface of a nanotube with the exact location of the tube failure.

Topics
Nanotubes, Atomic force microscopy
1.
S.
Iijima
,
Nature (London)
354
,
56
(
1991
).
Google Scholar
 
2.
M. M.
Treacy
,
T. W.
Ebbesen
, and
J. M.
Gibson
,
Nature (London)
381
,
678
(
1996
).
Google Scholar
 
3.
B. I.
Jacobson
,
C. J.
Brabec
, and
J.
Bernholc
,
Phys. Rev. Lett.
76
,
2511
(
1996
).
Google Scholar
 
4.
E. W.
Wong
,
P. E.
Sheehan
, and
C. M.
Lieber
,
Science
277
,
1971
(
1997
).
Google Scholar
 
5.
O.
Lourie
,
D. M.
Cox
, and
H. D.
Wagner
,
Phys. Rev. Lett.
81
,
1638
(
1998
).
Google Scholar
 
6.
S. J.
Tans
,
A. R. M.
Verschueren
, and
C.
Dekker
,
Nature (London)
393
,
49
(
1998
).
Google Scholar
 
7.
S.
Frank
,
P.
Poncharal
,
Z. L.
Wang
, and
W. A.
der Heer
,
Science
280
,
1744
(
1998
).
Google Scholar
 
8.
E. Graugnard, B. Walsh, S. Datta, P. J. de Pablo, and R. Reifenberger (unpublished data).
9.
C. T.
White
and
T. N.
Todorov
,
Nature (London)
393
,
240
(
1998
).
Google Scholar
 
10.
P. L.
McEuen
,
Nature (London)
393
,
15
(
1998
).
Google Scholar
 
11.
L. L.
Sohn
,
Nature (London)
394
,
131
(
1998
).
Google Scholar
 
12.
P. J.
de Pablo
,
E.
Graugnard
,
B.
Walsh
,
R. P.
Andres
,
S.
Datta
, and
R.
Reifenberger
,
Appl. Phys. Lett.
74
,
323
(
1999
).
Google Scholar
 
13.
Nanotec™, FGUAM, Edificio Rectorado, Universidad Autónoma de Madrid, E-28049 Madrid (Spain).
14.
P.
Zhang
,
P. E.
Lammert
, and
V. H.
Crespi
,
Phys. Rev. Lett.
81
,
5346
(
1998
).
Google Scholar
 
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1999
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