We report electroabsorption modulation of light at around 1550 nm in a unipolar InGaAlAs optical waveguide containing an InGaAs/AlAs double-barrier resonant tunneling diode (RTD). The RTD peak-to-valley transition increases the electric field across the waveguide, which shifts the core material absorption band edge to longer wavelengths via the Franz–Keldysh effect, thus changing the light-guiding characteristics of the waveguide. Low-frequency characterization of a device shows modulation up to 28 dB at 1565 nm. When dc biased close to the negative differential conductance region, the RTD optical waveguide behaves as an electroabsorption modulator integrated with a wide bandwidth electrical amplifier, offering a potential advantage over conventional pn modulators.
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29 November 1999
Research Article|
November 29 1999
Optical modulation at around 1550 nm in an InGaAlAs optical waveguide containing an InGaAs/AlAs resonant tunneling diode
J. M. L. Figueiredo;
J. M. L. Figueiredo
Department of Electronics and Electrical Engineering, University of Glasgow, Glasgow G12 8LT, United Kingdom
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A. R. Boyd;
A. R. Boyd
Department of Electronics and Electrical Engineering, University of Glasgow, Glasgow G12 8LT, United Kingdom
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C. R. Stanley;
C. R. Stanley
Department of Electronics and Electrical Engineering, University of Glasgow, Glasgow G12 8LT, United Kingdom
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C. N. Ironside;
C. N. Ironside
Department of Electronics and Electrical Engineering, University of Glasgow, Glasgow G12 8LT, United Kingdom
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S. G. McMeekin;
S. G. McMeekin
Cardiff School of Engineering, University of Wales Cardiff, Cardiff NP2 1XH, United Kingdom
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A. M. P. Leite
A. M. P. Leite
Centro de Física do Porto–ADFCUP, Universidade do Porto, Rua do Campo Alegre 687, 4169-007 PORTO, Portugal
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Appl. Phys. Lett. 75, 3443–3445 (1999)
Article history
Received:
June 24 1999
Accepted:
October 04 1999
Citation
J. M. L. Figueiredo, A. R. Boyd, C. R. Stanley, C. N. Ironside, S. G. McMeekin, A. M. P. Leite; Optical modulation at around 1550 nm in an InGaAlAs optical waveguide containing an InGaAs/AlAs resonant tunneling diode. Appl. Phys. Lett. 29 November 1999; 75 (22): 3443–3445. https://doi.org/10.1063/1.125290
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