Mössbauer spectroscopy with is used to characterize pulsed-laser-deposited (PLD) films is demonstrated. Mössbauer spectra were recorded as a function of film thickness (3–16 μm) for films deposited in background pressures of 50 and 200 mTorr, and for a zinc concentration of A spectrum was also recorded for deposited in a background pressure of 200 mTorr. The site occupancy was determined for the tetrahedral (A) and octahedral (B) sites. Results obtained here show that the effect of increasing the Zn is to shift Fe(tet) to Fe(oct). When compared with previous Mössbauer measurements on the bulk NiZn ferrites, the ferrite films give spectra of similar quality with no visible evidence of clustering or multiple phases present. The same linewidth was found for a PLD processed Fe film and a Mössbauer standard 70-μm-thick α-Fe enriched foil. The Fe film had a magnetic hyperfine field of 334 kOe and no evidence of the presence of any iron oxides. Good spectra may be obtained by selecting substrates with low mass and low atomic number. We were successful in obtaining measurable Mössbauer spectra for films deposited on 0.5-mm-thick MgO, sapphire, and alumina substrates whereas films deposited on Si, GaAs, and cubic zirconia substrates did not give good spectra.
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8 November 1999
Research Article|
November 08 1999
Transmission Mössbauer spectroscopy on pulsed-laser-deposited thick Fe and Ni–Zn ferrite films
F. W. Oliver;
F. W. Oliver
Morgan State University, Baltimore, Maryland 21251
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D. Seifu;
D. Seifu
Morgan State University, Baltimore, Maryland 21251
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E. Hoffman;
E. Hoffman
Morgan State University, Baltimore, Maryland 21251
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D. B. Chrisey;
D. B. Chrisey
Naval Research Laboratory, Washington, DC 20375
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J. S. Horwitz;
J. S. Horwitz
Naval Research Laboratory, Washington, DC 20375
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P. C. Dorsey
P. C. Dorsey
Naval Research Laboratory, Washington, DC 20375
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Appl. Phys. Lett. 75, 2993–2995 (1999)
Article history
Received:
April 19 1999
Accepted:
September 15 1999
Citation
F. W. Oliver, D. Seifu, E. Hoffman, D. B. Chrisey, J. S. Horwitz, P. C. Dorsey; Transmission Mössbauer spectroscopy on pulsed-laser-deposited thick Fe and Ni–Zn ferrite films. Appl. Phys. Lett. 8 November 1999; 75 (19): 2993–2995. https://doi.org/10.1063/1.125212
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