Boron nitride films with different cubic phase contents were deposited in a radio frequency bias sputtering system by a two-stage deposition process. The Fourier transform infrared spectra and UV-visible transmittance and reflection spectra were measured. The optical absorption edge of BN films consists of a low energy region in which α increases exponentially as incident photon energy and a high energy region, in which α varies as which is the characteristics of amorphous materials. These two regions are fitted by the Urbach tail model and the band-to-band transition model with an effective medium approach, and the Urbach energy and the optical band gap are determined from these fits. With an increase in the cubic boron nitride content, the absorption edge shifts to the higher energy and the optical band gap increases. For a BN film with 88% cubic phase, the optical band gap exceeds 6.0 eV, which is comparable to that of single crystal.
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5 July 1999
Research Article|
July 05 1999
Optical absorption edge characteristics of cubic boron nitride thin films
Guanghua Chen;
Guanghua Chen
Department of Applied Physics, Beijing Polytechnic University, Beijing 100022, People’s Republic of China
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Xingwang Zhang;
Xingwang Zhang
Department of Applied Physics, Beijing Polytechnic University, Beijing 100022, People’s Republic of China
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Bo Wang;
Bo Wang
Department of Applied Physics, Beijing Polytechnic University, Beijing 100022, People’s Republic of China
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Xuemei Song;
Xuemei Song
Department of Applied Physics, Beijing Polytechnic University, Beijing 100022, People’s Republic of China
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Bentao Cui;
Bentao Cui
Department of Applied Physics, Beijing Polytechnic University, Beijing 100022, People’s Republic of China
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Hui Yan
Hui Yan
Department of Applied Physics, Beijing Polytechnic University, Beijing 100022, People’s Republic of China
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Appl. Phys. Lett. 75, 10–12 (1999)
Article history
Received:
February 11 1999
Accepted:
May 10 1999
Citation
Guanghua Chen, Xingwang Zhang, Bo Wang, Xuemei Song, Bentao Cui, Hui Yan; Optical absorption edge characteristics of cubic boron nitride thin films. Appl. Phys. Lett. 5 July 1999; 75 (1): 10–12. https://doi.org/10.1063/1.124260
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