2.2-GeV Au-ions irradiation is used to study the effect of columnar defects on the transport properties of (Bi2212) bicrystals with high quality c-axis twist grain boundary. The studies show a similar increase in the irreversible temperature determined within the single crystals and across the grain boundaries after irradiation. However, the irradiation enhancement on the grain boundary critical current at low temperatures is small, compared to the more than an order of magnitude increase of single crystal
REFERENCES
1.
2.
N.
Tomita
, Y.
Takahashi
, and Y.
Ishida
, Jpn. J. Appl. Phys., Part 2
29
, L30
(1990
);N.
Tomita
, Y.
Takahashi
, M.
Mori
, and Y.
Ishida
, Jpn. J. Appl. Phys., Part 2
31
, L962
(1992
);J. L.
Wang
, X. Y.
Cai
, R. J.
Kelley
, M. D.
Vaudin
, S. E.
Babcock
, and D. C.
Larbalestier
, Physica C
230
, 189
(1994
).3.
Qiang
Li
, Y. N.
Tsay
, Y.
Zhu
, M.
Suenaga
, G. D.
Gu
, and N.
Koshizuka
, IEEE Trans. Appl. Supercond.
7
, 1584
(1997
);Y. N.
Tsay
, Q.
Li
, Y.
Zhu
, M.
Suenaga
, G. D.
Gu
, and N.
Koshizuka
, Proc. SPIE
3480
, 21
(1998
).4.
Y.
Zhu
, L.
Wu
, J. Y.
Wang
, Q.
Li
, Y. N.
Tsay
, and M.
Suenaga
, Microsc. Microanal.
3
, 423
(1997
);Y.
Zhu
, Q.
Li
, Y. N.
Tsay
, M.
Suenaga
, G. D.
Gu
, and N.
Koshizuka
, Phys. Rev. B
57
, 8601
(1998
).5.
Q.
Li
, Y.
Fukumoto
, Y.
Zhu
, M.
Suenaga
, T.
Kaneko
, K.
Sato
, and Ch.
Simon
, Phys. Rev. B
54
, R788
(1996
);Q.
Li
, M.
Suenaga
, T.
Kaneko
, K.
Sato
, and Ch.
Simon
, Appl. Phys. Lett.
71
, 1561
(1997
).6.
The size of our c-axis twist boundaries is a few hundreds μm, two orders of magnitudes larger than the Josephson penetration depth (a few μm) of the grain boundary junction. In the large junction limit, supercurrent flows within the width of near the edges of the junction.
7.
Y.
Fukumoto
, Y.
Zhu
, Q.
Li
, H. J.
Wiesmann
, M.
Suenaga
, T.
Kaneko
, K.
Sato
, K.
Shibutani
, T.
Hase
, S.
Hayashi
, and Ch.
Simon
, Phys. Rev. B
54
, 10210
(1996
).8.
H.
Safar
, J. H.
Cho
, S.
Fleshler
, M. P.
Maley
, J. O.
Willis
, J. Y.
Coulter
, J. L.
Ullmann
, G. N.
Riley
, Jr., M. W.
Rupich
, J. R.
Thompson
, and L.
Krusin-Elbaum
, Appl. Phys. Lett.
67
, 130
(1995
).
This content is only available via PDF.
© 1999 American Institute of Physics.
1999
American Institute of Physics
You do not currently have access to this content.