We report the study on the dielectric properties of films by means of capacitance and dissipation factor measurements at temperatures between 5 and 325 K. In addition to the structural phase transition at 260 K, we have observed a clear anomaly at K, which did not show up in previous dielectric studies. This result confirms the fact that a glass transition exists due to the freezing in of orientational disorder in A Debye-like relaxation in the dielectric response has also been observed, and the relaxation rate is thermally activated with an energy of about 277 meV, which is in good agreement with that obtained from other measurements.
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