Surface-emitting organic light emitting diode (OLED) was prepared by sputter deposition of indium-tin-oxide on a buffered organic layer structure. Confirming a previous report, a thin film of copper phthalocyanine (CuPc) was found to be a useful buffer layer in preventing sputter damage to the OLED layer structure, particularly the underlying Alq emissive layer. However, the CuPc layer forms an electron-injection barrier with the Alq layer, resulting in increased electron-hole recombination in the nonemissive CuPc layer, and thus a substantial reduction in electroluminescence efficiency. Incorporation of Li at the CuPc/Alq interface was found to reduce the injection barrier at the interface and recover the overall device efficiency with good surface emission characteristics.
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24 May 1999
Research Article|
May 24 1999
Interface engineering in preparation of organic surface-emitting diodes Available to Purchase
L. S. Hung;
L. S. Hung
Imaging Research and Advanced Development, Eastman Kodak Company, Rochester, New York 14650-2110
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C. W. Tang
C. W. Tang
Imaging Research and Advanced Development, Eastman Kodak Company, Rochester, New York 14650-2110
Search for other works by this author on:
L. S. Hung
Imaging Research and Advanced Development, Eastman Kodak Company, Rochester, New York 14650-2110
C. W. Tang
Imaging Research and Advanced Development, Eastman Kodak Company, Rochester, New York 14650-2110
Appl. Phys. Lett. 74, 3209–3211 (1999)
Article history
Received:
January 25 1999
Accepted:
March 23 1999
Citation
L. S. Hung, C. W. Tang; Interface engineering in preparation of organic surface-emitting diodes. Appl. Phys. Lett. 24 May 1999; 74 (21): 3209–3211. https://doi.org/10.1063/1.124107
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