The electrostatic interaction between two capacitively coupled, series-connected metal double dots is studied at low temperatures. Experiment shows that when the Coulomb blockade is lifted, by applying appropriate gate biases, in both double dots simultaneously, the conductance through each double dot becomes significantly lower than when only one double dot is conducting a current. The conductance lowering seen in interacting double dots is compared to that caused by an external ac modulation applied to the double-dot gates. The results suggest that the conductance lowering in each double dot is caused by a single-electron tunneling in the other double dot. Here, each double dot responds to the instantaneous, rather than average, potentials on the other double dot. This leads to correlated electron motion within the system, where the position of single electron in one double dot controls the tunneling rate through the other double dot.
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9 November 1998
Research Article|
November 09 1998
Correlated electron transport in coupled metal double dots Available to Purchase
Alexei O. Orlov;
Alexei O. Orlov
Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick, Notre Dame, Indiana 46556
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Islamshah Amlani;
Islamshah Amlani
Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick, Notre Dame, Indiana 46556
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Geza Toth;
Geza Toth
Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick, Notre Dame, Indiana 46556
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Craig S. Lent;
Craig S. Lent
Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick, Notre Dame, Indiana 46556
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Gary H. Bernstein;
Gary H. Bernstein
Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick, Notre Dame, Indiana 46556
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Gregory L. Snider
Gregory L. Snider
Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick, Notre Dame, Indiana 46556
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Alexei O. Orlov
Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick, Notre Dame, Indiana 46556
Islamshah Amlani
Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick, Notre Dame, Indiana 46556
Geza Toth
Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick, Notre Dame, Indiana 46556
Craig S. Lent
Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick, Notre Dame, Indiana 46556
Gary H. Bernstein
Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick, Notre Dame, Indiana 46556
Gregory L. Snider
Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick, Notre Dame, Indiana 46556
Appl. Phys. Lett. 73, 2787–2789 (1998)
Article history
Received:
June 02 1998
Accepted:
September 12 1998
Citation
Alexei O. Orlov, Islamshah Amlani, Geza Toth, Craig S. Lent, Gary H. Bernstein, Gregory L. Snider; Correlated electron transport in coupled metal double dots. Appl. Phys. Lett. 9 November 1998; 73 (19): 2787–2789. https://doi.org/10.1063/1.122591
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