The presence of 180° ferroelectric domains in polycrystalline thin films has been observed with the aid of transmission electron microscopy. The 180° domain boundary exhibited a curved appearance, and its orientational relationship was demonstrated. It was found that equiaxial grains did not have 180° domain boundaries due to their higher boundary energy. The grain size effect on dielectric constant of polycrystalline thin films was also discussed in conjunction with 180° ferroelectric domains.
REFERENCES
1.
2.
A. Y.
Wu
, F.
Wang
, C-B.
Ujang
, and C.
Bustamante
, Mater. Res. Soc. Symp. Proc.
200
, 261
(1990
).3.
4.
N. A.
Pertsev
, G.
Arlt
, and A. G.
Zembilgotov
, Phys. Rev. Lett.
76
, 1364
(1996
).5.
J. W.
Jang
, Y. H.
Kim
, T. S.
Hahn
, S. S.
Choi
, and S. J.
Chung
, Jpn. J. Appl. Phys., Part 2
35
, L699
(1996
).6.
7.
8.
R.
Gevers
, H.
Blank
, and S.
Amelinckx
, Phys. Status Solidi
13
, 449
(1966
).9.
M. J. Whelan, in Diffraction and Imaging Techniques in Materials Science, edited by S. Amelinckx, R. Gevers, and J. Van Landuyt (North-Holland, Amsterdam, 1978), Vol. 1, p. 56.
10.
Y. H.
Hu
, H. M.
Chan
, Z. X.
Wen
, and M. P.
Harmer
, J. Am. Ceram. Soc.
69
, 594
(1986
).11.
O.
Eible
, P.
Pongratz
, and P.
Skalicsky
, Philos. Mag. B
57
, 521
(1988
).12.
G.
Arlt
, D.
Hennings
, and G.
de With
, J. Appl. Phys.
58
, 1619
(1985
).13.
14.
J. W.
Jang
, S. J.
Chung
, W. J.
Cho
, T. S.
Hahn
, and S. S.
Choi
, J. Appl. Phys.
81
, 6322
(1997
).
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1998
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