Leakage current through epitaxial films was investigated to clarify the difference between the characteristics of nanometer and millimeter-size metal contacts. bottom electrode revealed genuine properties of a single metal/ contact and demonstrated that breakdown voltage and leakage current density at both nanometer and millimeter-size contacts were controlled by the Schottky barrier. However, in marked contrast with millimeter-size contacts, nanometer-size contacts conducted little current below breakdown voltage and repeatedly exhibited abrupt breakdowns having a giant current density The breakdown field was as high as at the forward bias, while no breakdown occurred up to at the reverse bias.
REFERENCES
1.
C.
Sudama
, A.
Campbell
, P.
Maniar
, R.
Jones
, R.
Moazzami
, C.
Mogab
, and J.
Lee
, J. Appl. Phys.
75
, 1014
(1994
).2.
G. W.
Dietz
, W.
Antpohler
, M.
Klee
, and R.
Waser
, J. Appl. Phys.
78
, 6113
(1995
).3.
S. R.
Gilbert
, L. A.
Willis
, B. W.
Wessels
, J. L.
Schindler
, J. A.
Thomas
, and C. R.
Kannewurf
, J. Appl. Phys.
80
, 969
(1996
).4.
Y.
Watanabe
, Y.
Matsumoto
, M.
Tanamura
, H.
Asami
, and A.
Kato
, Physica C
235–240
, 739
(1994
);5.
P.
Blom
, R.
Wolf
, J.
Cillessen
, and M.
Krijn
, Phys. Rev. Lett.
73
, 2107
(1994
).6.
K.
Gotoh
, H.
Tamura
, H.
Takeuchi
, and A.
Yoshida
, Jpn. J. Appl. Phys., Part 1
35
, 39
(1996
).7.
C. Yoshida, H. Tamura, A. Yoshida, and N. Yokoyama, Extended Abstract 57th Autumn Meeting Japan Society Appl. Phys. 465 (1996);
Y. Watanabe, Jpn. Patent Appl. Disclosure No. 7-263646 (1995).
8.
S.
Hosaka
, S.
Hosoki
, K.
Tanaka
, K.
Horiguchi
, and N.
Natsuaki
, Appl. Phys. Lett.
53
, 487
(1988
);9.
K.
Franke
, J.
Besold
, W.
Haessler
, and C.
Seegebarth
, Surf. Sci. Lett.
302
, L283
(1994
).10.
R.
Lüthi
, H.
Haefke
, K.-P.
Meyer
, E.
Meyer
, L.
Howald
, and H.-J.
Güntherodt
, J. Appl. Phys.
74
, 7461
(1993
).11.
Y.
Watanabe
, Y.
Matsumoto
, H.
Kunitomo
, M.
Tanamura
, and E.
Nishimoto
, Jpn. J. Appl. Phys., Part 1
33
, 5182
(1994
).12.
13.
J. J. O’Dwyer, The Theory of Electrical Conduction and Breakdown in Solid Dielectrics (Clarendon, Oxford, 1973);
14.
This model needs to be modified to explain the subsequent recurrent current jumps in Fig. 4.
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