We show that the p-type doping of Ga0.5In0.5P grown by solid-source molecular beam epitaxy using CBr4 as a carbon source is very strongly dependent upon the phosphorus flux and upon the substrate misorientation from (100). High densities of A-type steps and low phosphorus flux favor the incorporated carbon acting as a p-type dopant. We demonstrate that with the substrate orientation and phosphorus flux chosen to satisfy these two criteria, doping of C:Ga0.5In0.5P into the mid-1018holes/cm3 range can be achieved for the as-grown material.

1.
H.
Fujii
,
Y.
Ueno
,
A.
Gomyo
,
K.
Endo
, and
T.
Suzuki
,
Appl. Phys. Lett.
61
,
737
(
1992
).
2.
K.
Nakano
,
A.
Toda
,
T.
Yamamoto
, and
A.
Ishibashi
,
Appl. Phys. Lett.
61
,
1959
(
1992
).
3.
K. A.
Bertness
,
S. R.
Kurtz
,
D. J.
Friedman
,
A. E.
Kibbler
,
C.
Kramer
, and
J. M.
Olson
,
Appl. Phys. Lett.
65
,
989
(
1994
).
4.
T.
Takamoto
,
E.
Ikeda
,
H.
Kurita
, and
M.
Ohmori
,
Appl. Phys. Lett.
70
,
381
(
1997
).
5.
G. W.
Wicks
,
M. W.
Koch
,
J. A.
Varriano
,
F. G.
Johnson
,
C. R.
Wie
,
H. M.
Kim
, and
P.
Colombo
,
Appl. Phys. Lett.
59
,
342
(
1991
).
6.
T. J.
deLyon
,
N. I.
Buchan
,
P. D.
Kirchner
,
J. M.
Woodall
,
G. J.
Scilla
, and
F.
Cardone
,
Appl. Phys. Lett.
58
,
517
(
1991
).
7.
T. F.
Kuech
,
M. A.
Tischler
,
P.-J.
Wang
,
G.
Scilla
,
R.
Potemski
, and
F.
Cardone
,
Appl. Phys. Lett.
53
,
1317
(
1988
).
8.
T. P.
Chin
,
P. D.
Kirchner
,
J. M.
Woodall
, and
C. W.
Tu
,
Appl. Phys. Lett.
59
,
2865
(
1991
).
9.
M. V.
Tagare
,
T. P.
Chin
, and
J. M.
Woodall
,
J. Vac. Sci. Technol. B
14
,
2325
(
1996
).
10.
S.
Courmont
,
P.
Maurel
,
C.
Grattepain
, and
J.
Garcia
,
Appl. Phys. Lett.
64
,
1371
(
1994
).
11.
B. T.
Cunningham
,
L. J.
Guido
,
J. E.
Baker
,
J. S.
Major
,
N.
Holonyak
, and
G. E.
Stillman
,
Appl. Phys. Lett.
55
,
687
(
1989
).
12.
J.
Nagle
,
R. J.
Malik
, and
D.
Gershoni
,
J. Cryst. Growth
111
,
264
(
1991
).
13.
E. F.
Schubert
,
J. M.
Kuo
,
R. F.
Kopt
,
J. S.
Lufman
,
L. C.
Hopkins
, and
N. J.
Sauer
,
J. Appl. Phys.
67
,
1969
(
1990
).
14.
D. J. Friedman and A. E. Kibbler, presented at the 1997 Electronic Materials Conference (unpublished).
15.
R. G. Wilson, F. A. Stevie, and C. W. Magee, Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis (Wiley, New York, 1987).
16.
A. E.
Kibbler
,
S. R.
Kurtz
, and
J. M.
Olson
,
J. Cryst. Growth
109
,
258
(
1991
).
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