Electrically detected transient photocarrier grating method Available to Purchase

We present the measurement and analysis of the transient behavior of the photocurrent in amorphous semiconductor thin films in the presence of a photocarrier grating. The photocurrent transients are governed essentially by two processes, recombination and interdiffusion. The general features of the experimental findings can be reproduced analytically under small‐signal conditions. In a new method, which we call the electrically detected photocarrier grating method, the response time of photogenerated carriers and the ambipolar diffusion coefficient can be measured simultaneously.