An in situ study of the absolute magnetic moment of thin ferromagnetic films grown in ultrahigh vacuum (UHV) is described. The moments are measured using a newly innovated technique, rotating sample superconducting quantum interference device (SQUID) magnetometry (RSSM), in which the sample is spun at low frequency close to an ex situ second derivative superconducting pickup loop structure coupled to a rf SQUID. The sensitivity of the measurements is ≊10−6 emu, which corresponds to 1/10 of an atomic layer of Fe over a 0.5 cm2 area, and the geometry of the pickup loops makes the magnetometer very insensitive to background laboratory noise. The moment of Cr grown on Fe was measured. It was determined that the first two layers of Cr have an average moment of 0.75 μB per atom, and are antiferromagnetically aligned to the Fe film moment. The simplicity of RSSM and the fact that the absolute moment is measured makes this a powerful new approach for characterization of magnetic samples in UHV.
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26 December 1994
Research Article|
December 26 1994
Superconducting quantum interference device magnetometry during ultrahigh vacuum growth Available to Purchase
D. P. Pappas;
D. P. Pappas
Naval Research Laboratory, Washington, DC 20375
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G. A. Prinz;
G. A. Prinz
Naval Research Laboratory, Washington, DC 20375
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M. B. Ketchen
M. B. Ketchen
IBM Research Division, T. J. Watson Research Center, Yorktown Heights, New York 10598
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D. P. Pappas
Naval Research Laboratory, Washington, DC 20375
G. A. Prinz
Naval Research Laboratory, Washington, DC 20375
M. B. Ketchen
IBM Research Division, T. J. Watson Research Center, Yorktown Heights, New York 10598
Appl. Phys. Lett. 65, 3401–3403 (1994)
Article history
Received:
July 29 1994
Accepted:
October 24 1994
Citation
D. P. Pappas, G. A. Prinz, M. B. Ketchen; Superconducting quantum interference device magnetometry during ultrahigh vacuum growth. Appl. Phys. Lett. 26 December 1994; 65 (26): 3401–3403. https://doi.org/10.1063/1.112406
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