Tapping mode atomic force microscopy in liquids gives a substantial improvement in imaging quality and stability over standard contact mode. In tapping mode the probe‐sample separation is modulated as the probe scans over the sample. This modulation causes the probe to tap on the surface only at the extreme of each modulation cycle and therefore minimizes frictional forces that are present when the probe is constantly in contact with the surface. This imaging mode increases resolution and reduces sample damage on soft samples. For our initial experiments we used a tapping frequency of 17 kHz to image deoxyribonucleic acid plasmids on mica in water. When we imaged the same sample region with the same cantilever, the plasmids appeared 18 nm wide in contact mode and 5 nm in tapping mode.
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28 March 1994
Research Article|
March 28 1994
Tapping mode atomic force microscopy in liquids
P. K. Hansma;
P. K. Hansma
Department of Physics, University of California, Santa Barbara, California 93106
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J. P. Cleveland;
J. P. Cleveland
Department of Physics, University of California, Santa Barbara, California 93106
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M. Radmacher;
M. Radmacher
Department of Physics, University of California, Santa Barbara, California 93106
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D. A. Walters;
D. A. Walters
Department of Physics, University of California, Santa Barbara, California 93106
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P. E. Hillner;
P. E. Hillner
Department of Physics, University of California, Santa Barbara, California 93106
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M. Bezanilla;
M. Bezanilla
Department of Physics, University of California, Santa Barbara, California 93106
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M. Fritz;
M. Fritz
Department of Physics, University of California, Santa Barbara, California 93106
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D. Vie;
D. Vie
Department of Physics, University of California, Santa Barbara, California 93106
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H. G. Hansma;
H. G. Hansma
Department of Physics, University of California, Santa Barbara, California 93106
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C. B. Prater;
C. B. Prater
Digital Instruments, 520 E. Montecito Street, Santa Barbara, California 93103
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J. Massie;
J. Massie
Digital Instruments, 520 E. Montecito Street, Santa Barbara, California 93103
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L. Fukunaga;
L. Fukunaga
Digital Instruments, 520 E. Montecito Street, Santa Barbara, California 93103
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J. Gurley;
J. Gurley
Digital Instruments, 520 E. Montecito Street, Santa Barbara, California 93103
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V. Elings
V. Elings
Digital Instruments, 520 E. Montecito Street, Santa Barbara, California 93103
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Appl. Phys. Lett. 64, 1738–1740 (1994)
Article history
Received:
December 09 1993
Accepted:
January 25 1994
Citation
P. K. Hansma, J. P. Cleveland, M. Radmacher, D. A. Walters, P. E. Hillner, M. Bezanilla, M. Fritz, D. Vie, H. G. Hansma, C. B. Prater, J. Massie, L. Fukunaga, J. Gurley, V. Elings; Tapping mode atomic force microscopy in liquids. Appl. Phys. Lett. 28 March 1994; 64 (13): 1738–1740. https://doi.org/10.1063/1.111795
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