The growth by pulsed‐laser deposition of c‐axis‐oriented bismuth titanate (BTO)/YBa2Cu3O7(YBCO) superconductor heterostructures on [001]‐oriented Si with epitaxial yttria‐stabilized ZrO2 as a buffer layer is reported. X‐ray‐diffraction studies of the heterostructures show that all the layers grow in the c‐axis orientation, with a rocking angle of 1.0°–1.2° for the bismuth titanate layer and 0.6°–0.8° for the YBCO layer. Rutherford backscattering ion channeling yields of 28% at the surface have been obtained. Transmission electron microscopy of cross‐sectioned samples reveal that the BTO layer has a significant density of translational boundaries that propagate at 45° to the film surface. The BTO film exhibits ferroelectric hysteresis and a dielectric constant in the range of 180–200.

1.
J. F.
Scott
and
C. A.
Paz de Araujo
,
Science
,
246
,
1400
(
1989
);
M.
Sayer
and
K.
Sreenivas
,
Science
,
247
,
1056
(
1990
).
2.
A. F.
Tasch
, Jr.
, and
L. H.
Parker
,
Proc. IEEE
77
,
374
(
1989
);
L. H.
Parker
and
A. F.
Tasch
, Jr.
,
IEEE Circuits and Devices
CD-6
,
17
(
1990
).
3.
G. H.
Haertling
and
C. E.
Land
,
J. Ceram. Soc.
54
,
1
(
1971
).
4.
S. Y.
Wu
,
W. J.
Takei
, and
M. H.
Francombe
,
Ferroelectrics
10
,
209
(
1976
).
5.
R.
Ramesh
,
A.
Inam
,
W. K.
Chan
,
B.
Bilkens
,
K.
Myers
,
K.
Remschnig
,
D. L.
Hart
, and
J. M.
Tarascon
,
Science
252
,
944
(
1991
).
6.
D. K.
Fork
,
D. B.
Fenner
,
R. W.
Barton
,
J. M.
Phillips
,
G. A. N.
Connell
,
J. B.
Boyce
, and
T. H.
Geballe
,
Appl. Phys. Lett.
57
,
1161
(
1990
).
7.
X. D.
Wu
,
A.
Inam
,
M. S.
Hedge
,
B.
Wilkens
,
C. C.
Chang
,
D. M.
Hwang
,
L.
Nazar
,
T.
Venkatesan
,
S.
Miura
,
S.
Matsubara
,
Y.
Miyasaka
, and
N.
Shohata
,
Appl. Phys. Lett.
54
,
754
(
1989
).
8.
R.
Ramesh
,
D. M.
Hwang
,
T.
Venkatesan
,
T. S.
Ravi
,
L.
Nazar
,
A.
Inam
,
X. D.
Wu
,
B.
Dutta
,
G.
Thomas
,
A. F.
Marshall
, and
T. H.
Geballe
,
Science
247
,
57
(
1990
).
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