Simulation results of the temporal evolution of photocurrent in an interdigitated GaAs metal‐semiconductor‐metal photodetector are presented. The dependence of response time on the distance between fingers (0.1 and 0.25 μm) is investigated. The solutions of the time‐dependent Schrödinger equation and ensemble Monte Carlo calculations are employed. For a device with 0.1 μm finger spacing, the response time of an intrinsic detector is less than 2 ps, with hole current decay being the major limiting factor. The role of parasitics is shown to significantly increase the simulated response time.

1.
T.
Sugeta
,
T.
Urisu
,
S.
Sakata
, and
Y.
Mizushima
,
Jpn. J. Appl. Phys.
16
, Suppl.
19‐1
,
459
(
1980
).
2.
W.
Roth
,
H.
Schumacher
,
J.
Kluge
,
H. J.
Geelen
, and
H.
Beneking
,
IEEE Trans. Electron Devices
ED‐32
,
1034
(
1985
).
3.
M.
Ito
and
O.
Wada
,
IEEE J. Quantum Electron.
QE‐22
,
1073
(
1986
).
4.
W. C.
Koscielniak
,
R. M.
Kolbas
, and
M. A.
Littlejohn
,
IEEE Electron Device Lett.
9
,
485
(
1988
).
5.
B. J.
Van Zeghbroeck
,
W.
Patrick
,
J.‐M.
Halbout
, and
P.
Vettiger
,
IEEE Electron Device Lett.
9
,
527
(
1988
).
6.
M.
Ito
,
T.
Kumai
,
H.
Hamaguchi
,
M.
Makiuchi
,
K.
Nakai
,
O.
Wada
, and
T.
Sakurai
,
Appl. Phys. Lett.
47
,
1129
(
1985
).
7.
W. S.
Lee
,
G. R.
Adams
,
J.
Mun
, and
J.
Smith
,
Electron. Lett.
22
,
147
(
1986
).
8.
S. Ray and M. P. Walton, IEEE 1986 Microwave and Millimeter‐Wave Monolithic Circuits Symposium, Baltimore, June 4–5, Digest of Papers, 1986, p. 39.
9.
D. L.
Rogers
,
IEEE Electron Device Lett.
EDL‐7
,
600
(
1986
).
10.
C. S.
Harder
,
B.
Van Zeghbroeck
,
H.
Meier
,
W.
Patrick
, and
P.
Vettiger
,
IEEE Electron Device Lett.
9
,
171
(
1988
).
11.
P. Hesto, J.‐F. Pône, M. Mouis, J. L. Pelouard, and R. Castagné, NASE‐CODE IV Conference, Dublin, Ireland (1985).
12.
M. A.
Littlejohn
,
J. R.
Hauser
, and
T. H.
Glisson
,
J. Appl. Phys.
48
,
4587
(
1977
).
13.
S. Y. Wang, D. M. Bloom, and D. M. Collins, in Proceedings of the International Society of Optical Engineering, edited by G. Mourou (Society of Photo‐Optical Instrumentation Engineers, Bellingham, WA, 1983), Vol. 439, pp. 178–181.
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