The behavior of a current filament in a gold‐doped p+‐n Si diode was studied under a transverse magnetic field. The probe technique of electric potential was applied to measure the current distribution of the filament. By the action of the magnetic field, the filament was deformed and deflected toward one side of the diode. Moreover, a new ``filament instability'' which generates oscillation phenomena in the diode was observed.

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© 1972 The American Institute of Physics.
1972
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