Quantum information processing systems rely on cryogenic microwave electronics, and printed circuit board (PCB) laminates play an essential role, including integrating quantum chips and connecting microwave circuit elements. In this Letter, we report a method for accurately determining the microwave conductivity and complex permittivity of PCB laminates over a wide temperature range, from 4 to 300 K. The use of higher-order resonant modes of a balanced-type circular disk resonator (BCDR) enables broadband measurements ranging from below 5 GHz to above 20 GHz. Furthermore, a temperature-independent determination scheme is achieved by employing a pair of BCDRs and a cryogenic calibration technique. This method is demonstrated by measuring two commercially available PCB laminates. The results indicate that while dielectric loss is monotonically reduced at cryogenic temperatures, the reduction in conductor loss is strongly suppressed by the surface roughness of the copper foil. Additionally, the obtained conductivity as a function of frequency and temperature fits well with the Gradient Model, allowing for the evaluation of the root mean square roughness parameter.
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Determination of microwave material properties at cryogenic temperatures
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13 January 2025
Research Article|
January 15 2025
Determination of microwave material properties at cryogenic temperatures
Tomonori Arakawa
;
Tomonori Arakawa
a)
(Conceptualization, Data curation, Formal analysis, Funding acquisition, Investigation, Methodology, Project administration, Resources, Software, Supervision, Validation, Visualization, Writing – original draft, Writing – review & editing)
National Institute of Advanced Industrial Science and Technology (AIST)
, Tsukuba, Ibaraki 305-8563, Japan
a)Author to whom correspondence should be addressed: [email protected]
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Yuto Kato
;
Yuto Kato
(Conceptualization, Formal analysis, Investigation, Methodology, Software, Writing – review & editing)
National Institute of Advanced Industrial Science and Technology (AIST)
, Tsukuba, Ibaraki 305-8563, Japan
Search for other works by this author on:
Seitaro Kon
Seitaro Kon
(Conceptualization, Project administration, Resources, Supervision, Writing – review & editing)
National Institute of Advanced Industrial Science and Technology (AIST)
, Tsukuba, Ibaraki 305-8563, Japan
Search for other works by this author on:
a)Author to whom correspondence should be addressed: [email protected]
Appl. Phys. Lett. 126, 024001 (2025)
Article history
Received:
October 03 2024
Accepted:
December 05 2024
Citation
Tomonori Arakawa, Yuto Kato, Seitaro Kon; Determination of microwave material properties at cryogenic temperatures. Appl. Phys. Lett. 13 January 2025; 126 (2): 024001. https://doi.org/10.1063/5.0242356
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