In this work, we report a pixel reassignment based super-resolution reconstruction algorithm for structured illumination microscopy (entitled PR-SIM). PR-SIM provides a twofold theoretical resolution enhancement by reassigning the pixels in raw SIM images with respect to the center of each illumination fringe and applying further deconvolution. By comparing with frequency domain based algorithms, PR-SIM is more immune to fringe distortion and, hence, it is more suited for large-field SIM in that it processes the raw images locally. Meanwhile, the reconstruction speed of PR-SIM can be enhanced by skipping empty regions in the image and further enhanced by employing GPU-base parallel calculation. Overall, we can envisage that the PR-SIM can be extended for other illumination modulation based microscopic techniques.
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25 September 2023
Research Article|
September 29 2023
Super-resolution reconstruction of structured illumination microscopy based on pixel reassignment Available to Purchase
Xing Liu
;
Xing Liu
(Data curation, Formal analysis, Methodology, Validation, Writing – original draft, Writing – review & editing)
1
School of Physics, Xidian University
, Xi'an 710071, China
2
Key Laboratory of Optoelectronic Perception of Complex Environment, Ministry of Education
, Xi'an 710071, China
3
Engineering Research Center of Information Nanomaterials, Universities of Shaanxi Province
, Xi'an 710071, China
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Xiang Fang
;
Xiang Fang
(Data curation, Formal analysis)
1
School of Physics, Xidian University
, Xi'an 710071, China
2
Key Laboratory of Optoelectronic Perception of Complex Environment, Ministry of Education
, Xi'an 710071, China
3
Engineering Research Center of Information Nanomaterials, Universities of Shaanxi Province
, Xi'an 710071, China
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Yunze Lei
;
Yunze Lei
(Data curation, Formal analysis)
1
School of Physics, Xidian University
, Xi'an 710071, China
2
Key Laboratory of Optoelectronic Perception of Complex Environment, Ministry of Education
, Xi'an 710071, China
3
Engineering Research Center of Information Nanomaterials, Universities of Shaanxi Province
, Xi'an 710071, China
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Jiaoyue Li
;
Jiaoyue Li
(Data curation, Formal analysis, Resources)
1
School of Physics, Xidian University
, Xi'an 710071, China
2
Key Laboratory of Optoelectronic Perception of Complex Environment, Ministry of Education
, Xi'an 710071, China
3
Engineering Research Center of Information Nanomaterials, Universities of Shaanxi Province
, Xi'an 710071, China
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Sha An
;
Sha An
(Data curation, Formal analysis)
1
School of Physics, Xidian University
, Xi'an 710071, China
2
Key Laboratory of Optoelectronic Perception of Complex Environment, Ministry of Education
, Xi'an 710071, China
3
Engineering Research Center of Information Nanomaterials, Universities of Shaanxi Province
, Xi'an 710071, China
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Juanjuan Zheng
;
Juanjuan Zheng
(Data curation, Formal analysis)
1
School of Physics, Xidian University
, Xi'an 710071, China
2
Key Laboratory of Optoelectronic Perception of Complex Environment, Ministry of Education
, Xi'an 710071, China
3
Engineering Research Center of Information Nanomaterials, Universities of Shaanxi Province
, Xi'an 710071, China
4
State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences
, Xi'an 710119, China
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Ying Ma
;
Ying Ma
(Data curation, Formal analysis)
1
School of Physics, Xidian University
, Xi'an 710071, China
2
Key Laboratory of Optoelectronic Perception of Complex Environment, Ministry of Education
, Xi'an 710071, China
3
Engineering Research Center of Information Nanomaterials, Universities of Shaanxi Province
, Xi'an 710071, China
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Haiyang Ma
;
Haiyang Ma
(Data curation, Formal analysis)
1
School of Physics, Xidian University
, Xi'an 710071, China
2
Key Laboratory of Optoelectronic Perception of Complex Environment, Ministry of Education
, Xi'an 710071, China
3
Engineering Research Center of Information Nanomaterials, Universities of Shaanxi Province
, Xi'an 710071, China
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Zeev Zalevsky
;
Zeev Zalevsky
(Data curation, Formal analysis)
5
Faculty of Engineering and Nano Technology Center, Bar-Ilan University
, Ramat-Gan 5290002, Israel
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Peng Gao
Peng Gao
a)
(Conceptualization, Supervision, Writing – original draft, Writing – review & editing)
1
School of Physics, Xidian University
, Xi'an 710071, China
2
Key Laboratory of Optoelectronic Perception of Complex Environment, Ministry of Education
, Xi'an 710071, China
3
Engineering Research Center of Information Nanomaterials, Universities of Shaanxi Province
, Xi'an 710071, China
a)Author to whom correspondence should be addressed: [email protected]
Search for other works by this author on:
Xing Liu
1,2,3
Xiang Fang
1,2,3
Yunze Lei
1,2,3
Jiaoyue Li
1,2,3
Sha An
1,2,3
Juanjuan Zheng
1,2,3,4
Ying Ma
1,2,3
Haiyang Ma
1,2,3
Zeev Zalevsky
5
Peng Gao
1,2,3,a)
1
School of Physics, Xidian University
, Xi'an 710071, China
2
Key Laboratory of Optoelectronic Perception of Complex Environment, Ministry of Education
, Xi'an 710071, China
3
Engineering Research Center of Information Nanomaterials, Universities of Shaanxi Province
, Xi'an 710071, China
4
State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences
, Xi'an 710119, China
5
Faculty of Engineering and Nano Technology Center, Bar-Ilan University
, Ramat-Gan 5290002, Israel
a)Author to whom correspondence should be addressed: [email protected]
Appl. Phys. Lett. 123, 131111 (2023)
Article history
Received:
June 14 2023
Accepted:
September 15 2023
Citation
Xing Liu, Xiang Fang, Yunze Lei, Jiaoyue Li, Sha An, Juanjuan Zheng, Ying Ma, Haiyang Ma, Zeev Zalevsky, Peng Gao; Super-resolution reconstruction of structured illumination microscopy based on pixel reassignment. Appl. Phys. Lett. 25 September 2023; 123 (13): 131111. https://doi.org/10.1063/5.0162381
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