When we applied colloidal quantum dots (QDs) for quantum dot light emitting diodes, it was well known that shell thickness played an important role in core protection, confinement of electrons and holes, and charge injection efficiency. However, although the shell thickness dependence of electroluminescence properties was reported, carrier injection efficiency has not been discussed in detail. In this paper, we investigated the effect of shell thickness on the carrier injection efficiency that was evaluated by photoelectrochemical measurements. By comparing the product of internal quantum yield of photoluminescence and the evaluated carrier injection efficiency with external quantum efficiency (EQE) for QDs with various shell thicknesses, we found that the optimal shell thickness for increasing EQE is determined by the balance between protection of QD's surface and carrier injection efficiency.
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8 February 2021
Research Article|
February 10 2021
Photoelectrochemical investigation of charge injection efficiency for quantum dot light-emitting diode
Keisuke Kitano
;
Keisuke Kitano
a)
1
Life and Environment Research and Development BU, Sharp Corporation
, 2613-1 Ichinomotocho, Tenri, Nara 632-8567, Japan
2
The University of Tokyo Sharp Labs, Institute of Industrial Science, The University of Tokyo
, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
a)Author to whom correspondence should be addressed: kitano.keisuke@sharp.co.jp
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Yusuke Sakakibara;
Yusuke Sakakibara
3
Research and Development BU, Sharp Corporation
, 2613-1 Ichinomotocho, Tenri, Nara 632-8567, Japan
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Masashi Kago;
Masashi Kago
3
Research and Development BU, Sharp Corporation
, 2613-1 Ichinomotocho, Tenri, Nara 632-8567, Japan
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Takahiro Doe
;
Takahiro Doe
2
The University of Tokyo Sharp Labs, Institute of Industrial Science, The University of Tokyo
, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
3
Research and Development BU, Sharp Corporation
, 2613-1 Ichinomotocho, Tenri, Nara 632-8567, Japan
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Masaya Ueda;
Masaya Ueda
2
The University of Tokyo Sharp Labs, Institute of Industrial Science, The University of Tokyo
, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
3
Research and Development BU, Sharp Corporation
, 2613-1 Ichinomotocho, Tenri, Nara 632-8567, Japan
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Tatsuya Ryowa;
Tatsuya Ryowa
2
The University of Tokyo Sharp Labs, Institute of Industrial Science, The University of Tokyo
, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
3
Research and Development BU, Sharp Corporation
, 2613-1 Ichinomotocho, Tenri, Nara 632-8567, Japan
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Makoto Izumi;
Makoto Izumi
2
The University of Tokyo Sharp Labs, Institute of Industrial Science, The University of Tokyo
, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
3
Research and Development BU, Sharp Corporation
, 2613-1 Ichinomotocho, Tenri, Nara 632-8567, Japan
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Hiroyasu Nishi;
Hiroyasu Nishi
4
Institute of Industrial Science, The University of Tokyo
, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
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Tetsu Tatsuma;
Tetsu Tatsuma
4
Institute of Industrial Science, The University of Tokyo
, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
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Yasuhiko Arakawa
Yasuhiko Arakawa
5
Institute for Nano Quantum Information Electronics, The University of Tokyo
, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
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a)Author to whom correspondence should be addressed: kitano.keisuke@sharp.co.jp
Appl. Phys. Lett. 118, 063505 (2021)
Article history
Received:
December 09 2020
Accepted:
January 22 2021
Citation
Keisuke Kitano, Yusuke Sakakibara, Masashi Kago, Takahiro Doe, Masaya Ueda, Tatsuya Ryowa, Makoto Izumi, Hiroyasu Nishi, Tetsu Tatsuma, Yasuhiko Arakawa; Photoelectrochemical investigation of charge injection efficiency for quantum dot light-emitting diode. Appl. Phys. Lett. 8 February 2021; 118 (6): 063505. https://doi.org/10.1063/5.0039996
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