Accurate sizing of individual nanoparticles is crucial for the understanding of their physical and chemical properties and for their use in nanoscale devices. Optical sizing methods are non-invasive, rapid, and versatile. However, the low optical response of weakly absorbing subwavelength dielectric nanoparticles poses a fundamental challenge for their optical metrology. We demonstrate scalable optical sizing of such nanoparticles based on confocal scanning microscopy. The method is absolutely calibrated by correlating the optical signatures in the scattered pump laser signal to the ground truth nanoparticle sizes measured by an atomic force microscope. Using an air objective with a numerical aperture of 0.9, we measured the sizes of nanodiamond particles ranging from 35 to 175 nm, with an average error of ± 12.7 nm compared to the ground truth sizes. This technique paves the way for the metrology of a wide range of weakly scattering nano-objects for applications in biomedicine, catalysis, nanotechnology, and quantum optics.
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14 June 2021
Research Article|
June 16 2021
Rapid absolute sizing of deeply subwavelength dielectric nanoparticles by confocal scanning optical microscopy Available to Purchase
Swetapadma Sahoo
;
Swetapadma Sahoo
Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
and Holonyak Micro and Nanotechnology Lab, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
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Hana Azzouz;
Hana Azzouz
Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
and Holonyak Micro and Nanotechnology Lab, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
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Simeon I. Bogdanov
Simeon I. Bogdanov
a)
Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
and Holonyak Micro and Nanotechnology Lab, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
a)Author to whom correspondence should be addressed: [email protected]
Search for other works by this author on:
Swetapadma Sahoo
Hana Azzouz
Simeon I. Bogdanov
a)
Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
and Holonyak Micro and Nanotechnology Lab, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
a)Author to whom correspondence should be addressed: [email protected]
Appl. Phys. Lett. 118, 241105 (2021)
Article history
Received:
May 21 2021
Accepted:
May 22 2021
Citation
Swetapadma Sahoo, Hana Azzouz, Simeon I. Bogdanov; Rapid absolute sizing of deeply subwavelength dielectric nanoparticles by confocal scanning optical microscopy. Appl. Phys. Lett. 14 June 2021; 118 (24): 241105. https://doi.org/10.1063/5.0057471
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