The strain effect from a substrate is an important experimental route to control electronic and magnetic properties in transition-metal oxide (TMO) thin films. Using hard x-ray photoemission spectroscopy, we investigate the strain dependence of the valence states in LaNiO3 thin films, strongly correlated perovskite TMO, grown on four substrates: LaAlO3, (LaAlO3)0.3(SrAl0.5Ta0.5O3)0.7, SrTiO3, and DyScO3. A Madelung potential analysis of core-level spectra suggests that the point-charge description is valid for the La ions, while it breaks down for Ni and O ions due to a strong covalent bonding between the two. A clear x-ray photon-energy dependence of the valence spectra is analyzed by the density functional theory, which points to the presence of the La 5p state near the Fermi level.
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19 April 2021
Research Article|
April 19 2021
Hard x-ray photoemission study on strain effect in LaNiO3 thin films
K. Yamagami
;
K. Yamagami
a)
1
Institute for Solid State Physics, The University of Tokyo
, Kashiwa, Chiba 277-8581, Japan
2
Okinawa Institute of Science and Technology Graduate University
, Onna-son, Okinawa 904-0495, Japan
a)Author to whom correspondence should be addressed: [email protected]
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K. Ikeda;
K. Ikeda
1
Institute for Solid State Physics, The University of Tokyo
, Kashiwa, Chiba 277-8581, Japan
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A. Hariki
;
A. Hariki
3
Department of Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University
, Sakai, Osaka 599-8531, Japan
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Y. Zhang
;
Y. Zhang
4
Graduate School of Material Science, University of Hyogo
, Kamigori, Hyogo 678-1297, Japan
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A. Yasui;
A. Yasui
5
Japan Synchrotron Radiation Research Institute
, Sayo, Hyogo 679-5198, Japan
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Y. Takagi;
Y. Takagi
5
Japan Synchrotron Radiation Research Institute
, Sayo, Hyogo 679-5198, Japan
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Y. Hotta;
Y. Hotta
4
Graduate School of Material Science, University of Hyogo
, Kamigori, Hyogo 678-1297, Japan
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T. Katase
;
T. Katase
6
Laboratory for Materials and Structures, Institute of Innovative Research, Tokyo Institute of Technology
, Midori, Yokohama, Kanagawa 226-8503, Japan
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T. Kamiya
;
T. Kamiya
6
Laboratory for Materials and Structures, Institute of Innovative Research, Tokyo Institute of Technology
, Midori, Yokohama, Kanagawa 226-8503, Japan
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H. Wadati
H. Wadati
1
Institute for Solid State Physics, The University of Tokyo
, Kashiwa, Chiba 277-8581, Japan
4
Graduate School of Material Science, University of Hyogo
, Kamigori, Hyogo 678-1297, Japan
7
Institute of Laser Engineering, Osaka University
, Suita, Osaka 565-0871, Japan
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K. Yamagami
1,2,a)
K. Ikeda
1
A. Hariki
3
Y. Zhang
4
A. Yasui
5
Y. Takagi
5
Y. Hotta
4
T. Katase
6
T. Kamiya
6
H. Wadati
1,4,7
1
Institute for Solid State Physics, The University of Tokyo
, Kashiwa, Chiba 277-8581, Japan
2
Okinawa Institute of Science and Technology Graduate University
, Onna-son, Okinawa 904-0495, Japan
3
Department of Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University
, Sakai, Osaka 599-8531, Japan
4
Graduate School of Material Science, University of Hyogo
, Kamigori, Hyogo 678-1297, Japan
5
Japan Synchrotron Radiation Research Institute
, Sayo, Hyogo 679-5198, Japan
6
Laboratory for Materials and Structures, Institute of Innovative Research, Tokyo Institute of Technology
, Midori, Yokohama, Kanagawa 226-8503, Japan
7
Institute of Laser Engineering, Osaka University
, Suita, Osaka 565-0871, Japan
a)Author to whom correspondence should be addressed: [email protected]
Appl. Phys. Lett. 118, 161601 (2021)
Article history
Received:
January 13 2021
Accepted:
March 12 2021
Connected Content
A correction has been published:
Publisher's Note: “Hard x-ray photoemission study on strain effect in LaNiO3 thin films” [Appl. Phys Lett. 118, 161601 (2021)]
Citation
K. Yamagami, K. Ikeda, A. Hariki, Y. Zhang, A. Yasui, Y. Takagi, Y. Hotta, T. Katase, T. Kamiya, H. Wadati; Hard x-ray photoemission study on strain effect in LaNiO3 thin films. Appl. Phys. Lett. 19 April 2021; 118 (16): 161601. https://doi.org/10.1063/5.0044047
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