Diamond is a promising electronic semiconductor candidate that has recently attracted intense interest in the implementation of its superior physical properties in electronic devices. In particular, attention has been focused on the surface transfer doping of diamond, in which the hydrogen-terminated diamond (diamond:H) benefices of a unique conductive two-dimensional hole gas (2DHG) layer at the diamond's sub-surface upon coverage with a suitable surface acceptor. Several diamond:H transistors have been developed. However, their inherent architecture dependence on the diamond:H conductive surface sensitivity to harsh processing environments has been a major barrier to the realization of high-performance devices. Here, we report on a diamond:H transistor structure that incorporates a mutual diamond:H active channel into the hybrid model of a metal-semiconductor field-effect transistor (MESFET) and a self-aligned metal-insulator-semiconductor FET (MISFET) with a common gate connection. The resulting diamond:H hybrid transistor exhibits a beneficial symbiosis that includes the advantages of both the MISFET (a high ON current of 0.8 μA/μm and a low OFF current of ∼10−9 μA/μm) and MESFET (almost an ideal subthreshold swing of 67 mV/dec) performance operations in the same multilayered device.

1.
C. J. H.
Wort
and
R. S.
Balmer
,
Mater. Today
11
,
22
(
2008
).
2.
J.
Isberg
,
J.
Hammersberg
,
E.
Johansson
,
T.
Wikström
,
D. J.
Twitchen
,
A. J.
Whitehead
,
S. E.
Coe
, and
G. A.
Scarsbrook
,
Science
297
,
1670
(
2002
).
3.
G.
Daligou
and
J.
Pernot
,
Appl. Phys. Lett.
116
,
162105
(
2020
).
4.
S.
Yamasaki
,
E.
Gheeraert
, and
Y.
Koide
,
MRS Bull.
39
,
499
(
2014
).
5.
H.
Kawarada
,
M.
Aoki
, and
M.
Ito
,
Appl. Phys. Lett.
65
,
1563
(
1994
).
6.
S. A. O.
Russell
,
S.
Sharabim
,
A.
Tallaire
, and
D. A. J.
Moran
,
IEEE Electron Device Lett.
33
,
1471
(
2012
).
7.
M. I.
Landstrass
and
K. V.
Ravi
,
Appl. Phys. Lett.
55
,
975
(
1989
).
8.
O. A.
Williams
and
R. B.
Jackman
,
Semicond. Sci. Technol.
18
,
S34
(
2003
).
9.
C. E.
Nebel
, “
Surface-conducting diamond
,”
Science
318
,
1391
(
2007
).
10.
J.
Ristein
, “
Surface transfer doping of semiconductors
,”
Science
313
,
1057
(
2006
).
11.
V.
Chakrapani
,
J. C.
Angus
,
A. B.
Anderson
,
S. D.
Wolter
,
B. R.
Stoner
, and
G. U.
Sumanasekera
,
Science
318
,
1424
(
2007
).
12.
K. G.
Crawford
,
L.
Cao
,
D. C.
Qi
,
A.
Tallaire
,
E.
Limiti
,
C.
Verona
,
A. T. S.
Wee
, and
D. A. J.
Moran
,
Appl. Phys. Lett.
108
(
4
),
042103
(
2016
).
13.
M.
Tordjman
,
C.
Saguy
,
A.
Bolker
, and
R.
Kalish
,
Adv. Mater. Interface
1
,
1300155
(
2014
).
14.
M.
Tordjman
,
K.
Weinfeld
, and
R.
Kalish
,
Appl. Phys. Lett.
111
(
11
),
111601
(
2017
).
15.
A.
Laikhtman
,
A.
Lafosse
,
Y. L.
Coat
,
R.
Azria
, and
A.
Hoffman
,
Surf. Sci.
551
,
99
(
2004
).
16.
Z.
Yin
,
M.
Tordjman
,
Y.
Lee
,
A.
Vardi
,
R.
Kalish
, and
J. A.
del Alamo
,
Sci. Adv.
4
(
9
),
eaau0480
(
2018
).
17.
Z.
Yin
,
M.
Tordjman
,
A.
Vardi
,
R.
Kalish
, and
J. A.
del Alamo
,
IEEE Electron Device Lett.
39
(
4
),
540
(
2018
).
18.
A.
Vardi
,
M.
Tordjman
,
J. A.
del Alamo
, and
R.
Kalish
,
IEEE Electron Device Lett.
35
(
12
),
1320
1322
(
2014
).
19.
C.
Verona
,
W.
Ciccognani
,
S.
Colangeli
,
E.
Limiti
,
M.
Marinelli
,
G.
Verona-Rinati
,
D.
Cannata
,
M.
Benetti
, and
F.
Di Pietrantonio
,
IEEE Trans. Electron Devices
63
(
12
),
4647
4653
(
2016
).
20.
Z.
Ren
,
J.
Zhang
,
J.
Zhang
,
C.
Zhang
,
D.
Chen
,
P.
Yang
,
Y.
Li
, and
Y.
Hao
,
IEEE Electron Device Lett.
38
(
9
),
786
(
2017
).
21.
J. W.
Liu
,
M. Y.
Liao
,
M.
Imura
, and
Y.
Koide
,
Appl. Phys. Lett.
103
,
092905
(
2013
).
22.
J.
Liu
,
H.
Ohsato
,
X.
Wang
,
M.
Liao
, and
Y.
Koide
,
Sci. Rep.
6
,
34757
(
2016
).
23.
T.
Matsumoto
,
H.
Kato
,
K.
Oyama
,
T.
Makino
,
M.
Ogura
,
D.
Takeuchi
,
T.
Inokuma
,
N.
Tokuda
, and
S.
Yamasaki
,
Sci. Rep.
6
,
31585
(
2016
).
24.
J. W.
Liu
,
M. Y.
Liao
,
M.
Imura
,
R. G.
Banal
, and
Y.
Koide
,
J. Appl. Phys.
121
,
224502
(
2017
).
25.
J. W.
Liu
,
H.
Oosato
,
M. Y.
Liao
, and
Y.
Koide
,
Appl. Phys. Lett.
110
,
203502
(
2017
).
26.
H.
Umezawa
,
K.
Tsugawa
,
S.
Yamanaka
,
D.
Takeuchi
,
H.
Okushi
, and
H.
Kawarada
,
Jpn. J. Appl. Phys., Part 1
38
,
L1222
(
1999
).
27.
Z. H.
Feng
,
J. J.
Wang
,
Z. Z.
He
,
S. B.
Dun
,
C.
Yu
,
J. J.
Liu
,
P. W.
Zhang
,
H. G.
Hui
,
C. M.
Li
, and
S. J.
Cai
,
Sci. China Technol. Sci.
56
,
957
(
2013
).
28.
H.
Umezawa
,
T.
Matsumoto
, and
S.-I.
Shikata
,
IEEE Electron Device Lett.
35
,
1112
(
2014
).
29.
C.
Zhao
,
L.
Bie
,
R.
Zhang
, and
J.
Kanicki
,
IEEE Electron Device Lett.
35
,
75
(
2014
).
30.
S.
Elzwawi
,
A.
Hyland
,
M.
Lynam
,
J. G.
Partridge
,
D. G.
McCulloch
, and
M. W.
Allen
,
Semicond. Sci. Technol.
30
,
024008
(
2015
).
31.
G. T.
Dang
,
M. W.
Allen
,
M.
Furuta
, and
T.
Kawaharamura
,
Jpn. J. Appl. Phys., Part 1
58
,
090606
(
2019
).
32.
S. M.
Sze
and
K. K.
Ng
,
Physics of Semiconductor Devices
, 3rd ed. (
John Wiley & Sons, Inc
.,
2007
).
33.
A.
Ebong
and
N.
Chen
, in
Proceedings of the 9th International Conference on HONET
, Istanbul, Turkey (
2012
), pp.
102
109
.
34.
A.
Vardi
,
M.
Tordjman
,
R.
Kalish
, and
J. A.
del Alamo
,
IEEE Trans. Electron Devices
67
(
9
),
3516
(
2020
).
35.
K.
Tsugawa
,
H.
Noda
,
K.
Hirose
, and
H.
Kawarada
,
Phys. Rev. B.
81
,
045303
(
2010
).
36.
M.
Tordjman
,
A.
Bolker
,
C.
Saguy
,
E.
Baskin
,
P.
Bruno
,
D. M.
Gruen
, and
R.
Kalish
,
Adv. Funct. Mater.
22
(
9
),
1827
(
2012
).
37.
K.
Xing
,
A.
Tsai
,
S.
Rubanov
,
D. L.
Creedon
,
S. A.
Yianni
,
L.
Zhang
,
W. C.
Hao
,
J.
Zhuang
,
J. C.
McCallum
,
C. I.
Pakes
, and
D. C.
Qi
,
Appl. Phys. Lett.
116
,
111601
(
2020
).
38.
M.
Liao
,
L.
Sang
,
T.
Shimaoka
,
M.
Imura
,
S.
Koizumi
, and
Y.
Koide
,
Adv. Electron. Mater.
5
,
1800832
(
2019
).

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