A high-sensitivity 4H–SiC temperature sensor and an alpha detector have been fabricated using additively printed metal contacts. The surface morphology and electrical conductivity of the printed electrodes were established prior to Schottky diode development. 4H–SiC Schottky diodes with direct-write printed silver contacts on the 5 μm-thick epilayer on 4H–SiC were characterized electrically in terms of the forward and reverse current–voltage and high-frequency capacitance–voltage characteristics. The turn-on voltage of the Schottky diodes, as established from the forward current–voltage characteristics measured up to a temperature of 400 °C, showed a linear temperature dependence. Schottky diodes with direct-write printed Ag electrodes were able to measure alpha particles emitted from Americium-241. The high temperature and radiation response of the Schottky diodes show their suitability for multi-modal sensor fusion on the 4H–SiC platform for harsh environment applications.
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22 June 2020
Research Article|
June 25 2020
Thermal and radiation response of 4H–SiC Schottky diodes with direct-write electrical contacts
Neil R. Taylor
;
Neil R. Taylor
1
Oak Ridge National Laboratory
, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830, USA
2
Nuclear Engineering, Department of Mechanical and Aerospace Engineering, The Ohio State University
, 201 W. 19th Ave, Columbus, Ohio 43210, USA
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Yongchao Yu;
Yongchao Yu
1
Oak Ridge National Laboratory
, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830, USA
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Mihee Ji
;
Mihee Ji
1
Oak Ridge National Laboratory
, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830, USA
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Tolga Aytug;
Tolga Aytug
1
Oak Ridge National Laboratory
, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830, USA
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Shannon Mahurin;
Shannon Mahurin
1
Oak Ridge National Laboratory
, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830, USA
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Richard Mayes
;
Richard Mayes
1
Oak Ridge National Laboratory
, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830, USA
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Sacit Cetiner
;
Sacit Cetiner
1
Oak Ridge National Laboratory
, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830, USA
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M. Parans Paranthaman
;
M. Parans Paranthaman
1
Oak Ridge National Laboratory
, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830, USA
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Dianne Ezell
;
Dianne Ezell
1
Oak Ridge National Laboratory
, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830, USA
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Lei R. Cao
;
Lei R. Cao
2
Nuclear Engineering, Department of Mechanical and Aerospace Engineering, The Ohio State University
, 201 W. 19th Ave, Columbus, Ohio 43210, USA
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Pooran C. Joshi
Pooran C. Joshi
a)
1
Oak Ridge National Laboratory
, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830, USA
a)Author to whom correspondence should be addressed: [email protected]
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a)Author to whom correspondence should be addressed: [email protected]
Appl. Phys. Lett. 116, 252108 (2020)
Article history
Received:
March 16 2020
Accepted:
June 06 2020
Citation
Neil R. Taylor, Yongchao Yu, Mihee Ji, Tolga Aytug, Shannon Mahurin, Richard Mayes, Sacit Cetiner, M. Parans Paranthaman, Dianne Ezell, Lei R. Cao, Pooran C. Joshi; Thermal and radiation response of 4H–SiC Schottky diodes with direct-write electrical contacts. Appl. Phys. Lett. 22 June 2020; 116 (25): 252108. https://doi.org/10.1063/5.0007496
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