RF plasma assisted MBE growth of scandium nitride (ScN) thin films on Ga-polar GaN (0001)/SiC, Al-polar AlN (0001)/Al2O3, and Si-face 6H-SiC (0001) hexagonal substrates is found to lead to a face centered cubic (rock salt) crystal structure with (111) out-of-plane orientation instead of hexagonal orientation. Cubic (111) twinned patterns in ScN are observed by in situ electron diffraction during epitaxy, and the twin domains in ScN are detected by electron backscattered diffraction and further corroborated by X-ray diffraction. The epitaxial ScN films display very smooth, subnanometer surface roughness at a growth temperature of 750 °C. Temperature-dependent Hall-effect measurements indicate a constant high n-type carrier concentration of ∼1 × 1020/cm3 and an electron mobility of ∼20 cm2/V s.
Skip Nav Destination
CHORUS
Article navigation
21 October 2019
Research Article|
October 21 2019
Molecular beam epitaxial growth of scandium nitride on hexagonal SiC, GaN, and AlN
Joseph Casamento
;
Joseph Casamento
a)
1
Department of Materials Science and Engineering, Cornell University
, Ithaca, New York 14853, USA
a)Author to whom correspondence should be addressed: [email protected]
Search for other works by this author on:
John Wright;
John Wright
1
Department of Materials Science and Engineering, Cornell University
, Ithaca, New York 14853, USA
Search for other works by this author on:
Reet Chaudhuri
;
Reet Chaudhuri
2
School of Electrical and Computer Engineering, Cornell University
, Ithaca, New York 14853, USA
Search for other works by this author on:
Huili (Grace) Xing
;
Huili (Grace) Xing
1
Department of Materials Science and Engineering, Cornell University
, Ithaca, New York 14853, USA
2
School of Electrical and Computer Engineering, Cornell University
, Ithaca, New York 14853, USA
Search for other works by this author on:
Debdeep Jena
Debdeep Jena
1
Department of Materials Science and Engineering, Cornell University
, Ithaca, New York 14853, USA
2
School of Electrical and Computer Engineering, Cornell University
, Ithaca, New York 14853, USA
Search for other works by this author on:
a)Author to whom correspondence should be addressed: [email protected]
Appl. Phys. Lett. 115, 172101 (2019)
Article history
Received:
July 24 2019
Accepted:
October 07 2019
Citation
Joseph Casamento, John Wright, Reet Chaudhuri, Huili (Grace) Xing, Debdeep Jena; Molecular beam epitaxial growth of scandium nitride on hexagonal SiC, GaN, and AlN. Appl. Phys. Lett. 21 October 2019; 115 (17): 172101. https://doi.org/10.1063/1.5121329
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
Roadmap on photonic metasurfaces
Sebastian A. Schulz, Rupert. F. Oulton, et al.
Era of entropy: Synthesis, structure, properties, and applications of high-entropy materials
Christina M. Rost, Alessandro R. Mazza, et al.
Sputter epitaxy of ScAlN films on GaN high electron mobility transistor structures
Tomoya Okuda, Shunsuke Ota, et al.
Related Content
Bulk (100) scandium nitride crystal growth by sublimation on tungsten single crystal seeds
Appl. Phys. Lett. (September 2018)
Properties of bulk scandium nitride crystals grown by physical vapor transport
Appl. Phys. Lett. (April 2020)
Effects of adatom mobility and Ehrlich–Schwoebel barrier on heteroepitaxial growth of scandium nitride (ScN) thin films
Appl. Phys. Lett. (November 2020)
Ultrahigh purity plasma-enhanced atomic layer deposition and electrical properties of epitaxial scandium nitride
J. Vac. Sci. Technol. A (January 2025)
Gas source molecular beam epitaxy of scandium nitride on silicon carbide and gallium nitride surfaces
J. Vac. Sci. Technol. A (September 2014)