In microcrystal samples of the prototypical organic molecular semiconductors rubrene and C10-DNTT (2,9-didecyl-dinaphtho[2,3-b:2′,3′-f]thieno[3,2-b]thiophene), we measured spectra of complex optical conductivity caused by photocarriers with optical-pump terahertz-probe spectroscopy. We analyzed the spectra using the Drude-Smith model and evaluated the DC mobility , which includes extrinsic effects, and the intrinsic mobility . The resulting and values are comparable to the mobility values obtained using transport measurements of polycrystalline and single-crystalline field-effect transistors, respectively. This correspondence demonstrates that the intrinsic mobility values of organic molecular semiconductors can be evaluated from the measurements of microcrystal samples using transient terahertz spectroscopy.
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30 September 2019
Research Article|
September 30 2019
Evaluating intrinsic mobility from transient terahertz conductivity spectra of microcrystal samples of organic molecular semiconductors
H. Yada;
H. Yada
1
Department of Advanced Materials Science, University of Tokyo
, Kashiwa, Chiba 277-8561, Japan
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H. Sekine;
H. Sekine
1
Department of Advanced Materials Science, University of Tokyo
, Kashiwa, Chiba 277-8561, Japan
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T. Miyamoto;
T. Miyamoto
a)
1
Department of Advanced Materials Science, University of Tokyo
, Kashiwa, Chiba 277-8561, Japan
2
AIST-UTokyo Advanced Operando-Measurement Technology Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology
, Chiba 277-8568, Japan
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T. Terashige;
T. Terashige
2
AIST-UTokyo Advanced Operando-Measurement Technology Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology
, Chiba 277-8568, Japan
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R. Uchida;
R. Uchida
1
Department of Advanced Materials Science, University of Tokyo
, Kashiwa, Chiba 277-8561, Japan
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T. Otaki;
T. Otaki
1
Department of Advanced Materials Science, University of Tokyo
, Kashiwa, Chiba 277-8561, Japan
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F. Maruike;
F. Maruike
1
Department of Advanced Materials Science, University of Tokyo
, Kashiwa, Chiba 277-8561, Japan
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N. Kida;
N. Kida
1
Department of Advanced Materials Science, University of Tokyo
, Kashiwa, Chiba 277-8561, Japan
2
AIST-UTokyo Advanced Operando-Measurement Technology Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology
, Chiba 277-8568, Japan
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T. Uemura;
T. Uemura
b)
1
Department of Advanced Materials Science, University of Tokyo
, Kashiwa, Chiba 277-8561, Japan
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S. Watanabe;
S. Watanabe
1
Department of Advanced Materials Science, University of Tokyo
, Kashiwa, Chiba 277-8561, Japan
2
AIST-UTokyo Advanced Operando-Measurement Technology Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology
, Chiba 277-8568, Japan
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T. Okamoto;
T. Okamoto
1
Department of Advanced Materials Science, University of Tokyo
, Kashiwa, Chiba 277-8561, Japan
2
AIST-UTokyo Advanced Operando-Measurement Technology Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology
, Chiba 277-8568, Japan
3
PRESTO
, JST, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
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J. Takeya;
J. Takeya
1
Department of Advanced Materials Science, University of Tokyo
, Kashiwa, Chiba 277-8561, Japan
2
AIST-UTokyo Advanced Operando-Measurement Technology Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology
, Chiba 277-8568, Japan
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H. Okamoto
H. Okamoto
a)
1
Department of Advanced Materials Science, University of Tokyo
, Kashiwa, Chiba 277-8561, Japan
2
AIST-UTokyo Advanced Operando-Measurement Technology Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology
, Chiba 277-8568, Japan
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a)
Electronic addresses: miyamoto@k.u-tokyo.ac.jp and okamotoh@k.u-tokyo.ac.jp
b)
Present address: The Institute of Scientific and Industrial Research, Osaka University 8-1, Mihogaoka, Ibaraki, Osaka 567-0047, Japan.
Appl. Phys. Lett. 115, 143301 (2019)
Article history
Received:
July 02 2019
Accepted:
September 04 2019
Citation
H. Yada, H. Sekine, T. Miyamoto, T. Terashige, R. Uchida, T. Otaki, F. Maruike, N. Kida, T. Uemura, S. Watanabe, T. Okamoto, J. Takeya, H. Okamoto; Evaluating intrinsic mobility from transient terahertz conductivity spectra of microcrystal samples of organic molecular semiconductors. Appl. Phys. Lett. 30 September 2019; 115 (14): 143301. https://doi.org/10.1063/1.5118262
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