InAs/GaAs quantum dots (QDs) grown by molecular beam epitaxy were subjected to in situ irradiation using a mono-beam pulsed laser. The evolution of the QD morphology was investigated as a function of irradiation intensity at temperatures of 525 °C and 480 °C. The temperature was found to exert a considerable influence on the reaction of the QDs to the irradiation. At the higher temperature (525 °C), both the height and width of the InAs QDs gradually decreased with increasing irradiation intensity, which was ascribed to the dominant effect of the laser desorption of indium. In contrast, at the lower temperature (480 °C), the height of the InAs islands decreased with increasing irradiation intensity while the width exhibited unexpected broadening, which was attributed to a combination of laser desorption and laser diffusion of indium. Remarkably, at the higher temperature, laser irradiation above a certain threshold intensity resulted in the lift off of the InAs QDs to afford a clear, smooth, and perfect GaAs surface. Through subsequent growth of QDs on this surface, it was found that the QDs exhibited the same nucleation properties and optical quality as the common Stranski–Krastanov mode on an as-prepared GaAs surface. Therefore, we have developed a technology for the damage-resistant fabrication of QDs using in situ pulsed laser irradiation (LIR), which is expected to find potential applications in the manufacture of patterned QDs upon upgrading the mono-beam irradiation to multi-beam interference irradiation in the future.
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20 August 2018
Research Article|
August 24 2018
In situ lift-off of InAs quantum dots by pulsed laser irradiation
Changwei Deng;
Changwei Deng
a)
1
School of Optoelectronic Science and Engineering and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University
, Suzhou 215006, China
2
Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province and Key Lab of Modern Optical Technologies of Education Ministry of China, Soochow University
, Suzhou 215006, China
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Zhenwu Shi
;
Zhenwu Shi
b)
1
School of Optoelectronic Science and Engineering and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University
, Suzhou 215006, China
2
Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province and Key Lab of Modern Optical Technologies of Education Ministry of China, Soochow University
, Suzhou 215006, China
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Linyun Yang;
Linyun Yang
a)
1
School of Optoelectronic Science and Engineering and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University
, Suzhou 215006, China
2
Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province and Key Lab of Modern Optical Technologies of Education Ministry of China, Soochow University
, Suzhou 215006, China
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Wei Zhang;
Wei Zhang
3
Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences
, Suzhou 215123, China
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Chen Chen
;
Chen Chen
1
School of Optoelectronic Science and Engineering and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University
, Suzhou 215006, China
2
Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province and Key Lab of Modern Optical Technologies of Education Ministry of China, Soochow University
, Suzhou 215006, China
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Lili Miao;
Lili Miao
1
School of Optoelectronic Science and Engineering and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University
, Suzhou 215006, China
2
Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province and Key Lab of Modern Optical Technologies of Education Ministry of China, Soochow University
, Suzhou 215006, China
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Xinning Yang;
Xinning Yang
1
School of Optoelectronic Science and Engineering and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University
, Suzhou 215006, China
2
Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province and Key Lab of Modern Optical Technologies of Education Ministry of China, Soochow University
, Suzhou 215006, China
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Chinhua Wang;
Chinhua Wang
1
School of Optoelectronic Science and Engineering and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University
, Suzhou 215006, China
2
Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province and Key Lab of Modern Optical Technologies of Education Ministry of China, Soochow University
, Suzhou 215006, China
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Linsen Chen;
Linsen Chen
1
School of Optoelectronic Science and Engineering and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University
, Suzhou 215006, China
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Changsi Peng
Changsi Peng
b)
1
School of Optoelectronic Science and Engineering and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University
, Suzhou 215006, China
2
Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province and Key Lab of Modern Optical Technologies of Education Ministry of China, Soochow University
, Suzhou 215006, China
4
Institute for Research in Applicable Computing, University of Bedfordshire
, Park Square, Luton LU1 3JU, United Kingdom
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a)
C. Deng and L. Yang contributed equally to this work.
b)
Electronic addresses: [email protected] and [email protected]
Appl. Phys. Lett. 113, 083111 (2018)
Article history
Received:
March 31 2018
Accepted:
August 08 2018
Citation
Changwei Deng, Zhenwu Shi, Linyun Yang, Wei Zhang, Chen Chen, Lili Miao, Xinning Yang, Chinhua Wang, Linsen Chen, Changsi Peng; In situ lift-off of InAs quantum dots by pulsed laser irradiation. Appl. Phys. Lett. 20 August 2018; 113 (8): 083111. https://doi.org/10.1063/1.5031813
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