This study demonstrates an enhancement of spin-orbit coupling in silicon (Si) thin films by doping with bismuth (Bi), a heavy metal, using ion implantation. Quantum corrections to conductance at low temperatures in phosphorous-doped Si before and after Bi implantation are measured to probe the increase in spin-orbit coupling, and a clear modification of magnetoconductance signals is observed: Bi doping changes magnetoconductance from weak localization to the crossover between weak localization and weak antilocalization. The elastic diffusion length, phase coherence length, and spin-orbit coupling length in Si with and without Bi implantation are estimated, and the spin-orbit coupling length after Bi doping becomes the same order of magnitude (Lso = 54 nm) with the phase coherence length (Lφ = 35 nm) at 2 K. This is an experimental proof that spin-orbit coupling strength in the thin Si film is tunable by doping with heavy metals.
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17 September 2018
Research Article|
September 21 2018
Spin-orbit coupling induced by bismuth doping in silicon thin films
F. Rortais
;
F. Rortais
a)
Department of Electronic Science and Engineering, Kyoto University
, Kyoto 615-8510, Japan
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S. Lee;
S. Lee
Department of Electronic Science and Engineering, Kyoto University
, Kyoto 615-8510, Japan
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R. Ohshima;
R. Ohshima
Department of Electronic Science and Engineering, Kyoto University
, Kyoto 615-8510, Japan
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S. Dushenko
;
S. Dushenko
Department of Electronic Science and Engineering, Kyoto University
, Kyoto 615-8510, Japan
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Y. Ando;
Y. Ando
Department of Electronic Science and Engineering, Kyoto University
, Kyoto 615-8510, Japan
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M. Shiraishi
M. Shiraishi
Department of Electronic Science and Engineering, Kyoto University
, Kyoto 615-8510, Japan
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a)
E-mail: [email protected]
Appl. Phys. Lett. 113, 122408 (2018)
Article history
Received:
July 01 2018
Accepted:
September 08 2018
Citation
F. Rortais, S. Lee, R. Ohshima, S. Dushenko, Y. Ando, M. Shiraishi; Spin-orbit coupling induced by bismuth doping in silicon thin films. Appl. Phys. Lett. 17 September 2018; 113 (12): 122408. https://doi.org/10.1063/1.5046781
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