The correlative use of atom probe tomography (APT) and energy dispersive x-ray spectroscopy in scanning transmission electron microscopy (STEM) allows us to characterize the structure of ZnTe/CdSe superlattices at the nanometre scale. Both techniques reveal the segregation of zinc along  stacking faults in CdSe layers, which is interpreted as a manifestation of the Suzuki effect. Quantitative measurements reveal a zinc enrichment around 9 at. % correlated with a depletion of cadmium in the stacking faults. Raw concentration data were corrected so as to account for the limited spatial resolution of both STEM and APT techniques. A simple calculation reveals that the stacking faults are almost saturated in Zn atoms (∼66 at. % of Zn) at the expense of Cd that is depleted.
High spatial resolution correlated investigation of Zn segregation to stacking faults in ZnTe/CdSe nanostructures
Bastien Bonef, Adeline Grenier, Lionel Gerard, Pierre-Henri Jouneau, Regis André, Didier Blavette, Catherine Bougerol; High spatial resolution correlated investigation of Zn segregation to stacking faults in ZnTe/CdSe nanostructures. Appl. Phys. Lett. 26 February 2018; 112 (9): 093102. https://doi.org/10.1063/1.5020440
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