We grew fully strained epitaxial LaCrO3 (LCO) films on SrTiO3(001) under layer-by-layer control up to the film thickness of t = 130 nm using a pulsed laser deposition method. The spin axis of the antiferromagnetic LCO film was systematically examined as a function of t by using Cr L2,3-edge x-ray magnetic linear dichroism (XMLD). The XMLD results manifest a spin reorientation transition (SRT) across a transition thickness of tT ∼ 60 nm. This SRT is well explained in terms of two competing magnetic anisotropy energies of the surface/interface (KS) and the LCO film itself (KV).
Thickness driven spin reorientation transition of epitaxial LaCrO3 films
Junho Park, Dong-Hwan Kim, Doopyo Lee, Kyung-Tae Ko, Jong Hyun Song, Jae-Young Kim, Tae-Yeong Koo, Seung Ran Lee, Jae-Hoon Park; Thickness driven spin reorientation transition of epitaxial LaCrO3 films. Appl. Phys. Lett. 12 March 2018; 112 (11): 112403. https://doi.org/10.1063/1.5021950
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