A nonlinear magnetoresistance—called unidirectional spin-Hall magnetoresistance—is recently experimentally discovered in metallic bilayers consisting of a heavy metal and a ferromagnetic metal. To study the fundamental mechanism of unidirectional spin-Hall magnetoresistance (USMR), both ferromagnetic and heavy metallic layer thickness dependence of the USMR are presented in a Pt/Co/AlOx trilayer at room temperature. To avoid ambiguities, second harmonic Hall measurements are used for separating spin-Hall and thermal contributions to the non-linear magnetoresistance. The experimental results are fitted by using a drift-diffusion theory, with parameters extracted from an analysis of longitudinal resistivity of the Co layer within the framework of the Fuchs-Sondheimer model. A good agreement with the theory is found, demonstrating that the USMR is governed by both the spin-Hall effect in the heavy metallic layer and the metallic diffusion process in the ferromagnetic layer.
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4 December 2017
Research Article|
December 05 2017
Thickness dependence of unidirectional spin-Hall magnetoresistance in metallic bilayers
Yuxiang Yin
;
Yuxiang Yin
a)
1
Department of Applied Physics, Eindhoven University of Technology
, PO Box 513, 5600 MB Eindhoven, The Netherlands
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Dong-Soo Han;
Dong-Soo Han
1
Department of Applied Physics, Eindhoven University of Technology
, PO Box 513, 5600 MB Eindhoven, The Netherlands
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Mark C. H. de Jong;
Mark C. H. de Jong
1
Department of Applied Physics, Eindhoven University of Technology
, PO Box 513, 5600 MB Eindhoven, The Netherlands
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Reinoud Lavrijsen;
Reinoud Lavrijsen
1
Department of Applied Physics, Eindhoven University of Technology
, PO Box 513, 5600 MB Eindhoven, The Netherlands
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Rembert A. Duine;
Rembert A. Duine
1
Department of Applied Physics, Eindhoven University of Technology
, PO Box 513, 5600 MB Eindhoven, The Netherlands
2
Institute for Theoretical Physics and Center for Extreme Matter and Emergent Phenomena, Utrecht University
, Leuvenlaan 4, 3584 CE Utrecht, The Netherlands
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Henk J. M. Swagten;
Henk J. M. Swagten
1
Department of Applied Physics, Eindhoven University of Technology
, PO Box 513, 5600 MB Eindhoven, The Netherlands
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Bert Koopmans
Bert Koopmans
1
Department of Applied Physics, Eindhoven University of Technology
, PO Box 513, 5600 MB Eindhoven, The Netherlands
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a)
E-mail: y.yin@tue.nl
Appl. Phys. Lett. 111, 232405 (2017)
Article history
Received:
September 07 2017
Accepted:
November 17 2017
Citation
Yuxiang Yin, Dong-Soo Han, Mark C. H. de Jong, Reinoud Lavrijsen, Rembert A. Duine, Henk J. M. Swagten, Bert Koopmans; Thickness dependence of unidirectional spin-Hall magnetoresistance in metallic bilayers. Appl. Phys. Lett. 4 December 2017; 111 (23): 232405. https://doi.org/10.1063/1.5003725
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