Over the last decade, scattering-type scanning near-field optical microscopy and spectroscopy have been widely used in nano-photonics and material research due to their fine spatial resolution and broad spectral range. A number of simplified analytical models have been proposed to quantitatively understand the tip-scattered near-field signal. However, a rigorous interpretation of the experimental results is still lacking at this stage. Numerical modelings, on the other hand, are mostly done by simulating the local electric field slightly above the sample surface, which only qualitatively represents the near-field signal rendered by the tip-sample interaction. In this work, we performed a more comprehensive numerical simulation which is based on realistic experimental parameters and signal extraction procedures. By directly comparing to the experiments as well as other simulation efforts, our methods offer a more accurate quantitative description of the near-field signal, paving the way for future studies of complex systems at the nanoscale.
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27 November 2017
Research Article|
December 01 2017
Rigorous numerical modeling of scattering-type scanning near-field optical microscopy and spectroscopy
Xinzhong Chen;
Xinzhong Chen
1
Department of Physics and Astronomy, Stony Brook University
, Stony Brook, New York 11794, USA
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Chiu Fan Bowen Lo;
Chiu Fan Bowen Lo
1
Department of Physics and Astronomy, Stony Brook University
, Stony Brook, New York 11794, USA
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William Zheng;
William Zheng
2
Department of Physics, Columbia University
, New York, New York 10027, USA
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Hai Hu;
Hai Hu
3
Division of Nanophotonics, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology
, Beijing 100190, People's Republic of China
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Qing Dai;
Qing Dai
a)
3
Division of Nanophotonics, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology
, Beijing 100190, People's Republic of China
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Mengkun Liu
Mengkun Liu
a)
1
Department of Physics and Astronomy, Stony Brook University
, Stony Brook, New York 11794, USA
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a)
Electronic mail: daiq@nanoctr.cn and mengkun.liu@stonybrook.edu
Appl. Phys. Lett. 111, 223110 (2017)
Article history
Received:
October 09 2017
Accepted:
November 12 2017
Citation
Xinzhong Chen, Chiu Fan Bowen Lo, William Zheng, Hai Hu, Qing Dai, Mengkun Liu; Rigorous numerical modeling of scattering-type scanning near-field optical microscopy and spectroscopy. Appl. Phys. Lett. 27 November 2017; 111 (22): 223110. https://doi.org/10.1063/1.5008663
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