We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a single nano-aperture in a gold film is mapped by measuring the lateral optical force between the apex of the AFM probe and the nano-aperture. The fundamental torsional eigen-mode of an AFM cantilever probe was used to detect the laterally induced optical forces. We engineered the cantilever shape using focused ion beam milling to improve the detected signal to noise ratio. The measured distributions of lateral optical force agree well with electromagnetic simulations of the metal coated AFM probe interacting with the nano-aperture. This technique can be extended to simultaneously detect both lateral and longitudinal optical forces at the nanoscale by using an AFM cantilever as a multi-channel detector. This will enable simultaneous Photon Induced Force Microscopy detection of molecular responses with different incident field polarizations. The technique can be implemented on both cantilever and tuning fork based AFMs.
Skip Nav Destination
Article navigation
6 February 2017
Research Article|
February 08 2017
Measurement of laterally induced optical forces at the nanoscale
Fei Huang;
Fei Huang
1Department of Electrical Engineering and Computer Science, 142 Engineering Tower,
University of California
, Irvine, California 92697, USA
Search for other works by this author on:
Venkata Ananth Tamma
;
Venkata Ananth Tamma
2CaSTL Center, Department of Chemistry,
University of California
, Irvine, California 92697, USA
Search for other works by this author on:
Mohsen Rajaei
;
Mohsen Rajaei
1Department of Electrical Engineering and Computer Science, 142 Engineering Tower,
University of California
, Irvine, California 92697, USA
Search for other works by this author on:
Mohammad Almajhadi
;
Mohammad Almajhadi
1Department of Electrical Engineering and Computer Science, 142 Engineering Tower,
University of California
, Irvine, California 92697, USA
Search for other works by this author on:
H. Kumar Wickramasinghe
H. Kumar Wickramasinghe
a)
1Department of Electrical Engineering and Computer Science, 142 Engineering Tower,
University of California
, Irvine, California 92697, USA
Search for other works by this author on:
a)
Author to whom correspondence should be addressed. Electronic mail: hkwick@uci.edu
Appl. Phys. Lett. 110, 063103 (2017)
Article history
Received:
November 28 2016
Accepted:
January 20 2017
Citation
Fei Huang, Venkata Ananth Tamma, Mohsen Rajaei, Mohammad Almajhadi, H. Kumar Wickramasinghe; Measurement of laterally induced optical forces at the nanoscale. Appl. Phys. Lett. 6 February 2017; 110 (6): 063103. https://doi.org/10.1063/1.4975682
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Pay-Per-View Access
$40.00
Citing articles via
Topological and chiral matter—Physics and applications
Maia G. Vergniory, Takeshi Kondo, et al.
Roadmap on photonic metasurfaces
Sebastian A. Schulz, Rupert. F. Oulton, et al.
Feedback cooling of an insulating high-Q diamagnetically levitated plate
S. Tian, K. Jadeja, et al.
Related Content
Development of low-temperature and ultrahigh-vacuum photoinduced force microscopy
Rev. Sci. Instrum. (March 2023)
Three-dimensional photoinduced force microscopy reveals artifacts from photothermal tip vibrations
J. Appl. Phys. (October 2023)
Heterodyne technique in photoinduced force microscopy with photothermal effect
Appl. Phys. Lett. (March 2017)
Stimulated Raman spectroscopy and nanoscopy of molecules using near field photon induced forces without resonant electronic enhancement gain
Appl. Phys. Lett. (June 2016)
Mapping electric field components of superchiral field with photo-induced force
J. Chem. Phys. (January 2024)