Formation, emission, and lasing properties of strain-free InP(As)/AlInAs quantum dots (QDs) embedded in AlInAs microdisk (MD) cavity were investigated using transmission electron microscopy and photoluminescence (PL) techniques. In MD structures, the QDs have the nano-pan-cake shape with the height of ∼2 nm, the lateral size of 20–50 nm, and the density of ∼5 × 109 cm−2. Their emission observed at ∼940 nm revealed strong temperature quenching, which points to exciton decomposition. It also showed unexpected type-I character, indicating In-As intermixing as confirmed by band structure calculations. We observed lasing of InP(As) QD excitons into whispering gallery modes in MD having the diameter of ∼3.2 μm and providing a free spectral range of ∼27 nm and quality factors up to Q∼13 000. Threshold of ∼50 W/cm2 and spontaneous emission coupling coefficient of ∼0.2 were measured for this MD-QD system.
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20 March 2017
Research Article|
March 20 2017
Excitonic lasing of strain-free InP(As) quantum dots in AlInAs microdisk Available to Purchase
D. V. Lebedev;
D. V. Lebedev
1Ioffe Physico-Technical Institute,
Russian Academy of Sciences
, Saint Petersburg 194021, Russia
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M. M. Kulagina;
M. M. Kulagina
1Ioffe Physico-Technical Institute,
Russian Academy of Sciences
, Saint Petersburg 194021, Russia
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S. I. Troshkov
;
S. I. Troshkov
1Ioffe Physico-Technical Institute,
Russian Academy of Sciences
, Saint Petersburg 194021, Russia
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A. S. Vlasov;
A. S. Vlasov
1Ioffe Physico-Technical Institute,
Russian Academy of Sciences
, Saint Petersburg 194021, Russia
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V. Y. Davydov;
V. Y. Davydov
1Ioffe Physico-Technical Institute,
Russian Academy of Sciences
, Saint Petersburg 194021, Russia
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A. N. Smirnov;
A. N. Smirnov
1Ioffe Physico-Technical Institute,
Russian Academy of Sciences
, Saint Petersburg 194021, Russia
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A. A. Bogdanov;
A. A. Bogdanov
2
ITMO University
, Saint Petersburg 199034, Russia
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J. L. Merz;
J. L. Merz
3Electrical Engineering,
University of Notre Dame
, Notre Dame, Indiana 46556, USA
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J. Kapaldo;
J. Kapaldo
4Physics Department,
University of Notre Dame
, Notre Dame, Indiana 46556, USA
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A. Gocalinska;
A. Gocalinska
5Tyndall National Institute,
University College Cork
, Ireland
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G. Juska;
G. Juska
5Tyndall National Institute,
University College Cork
, Ireland
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S. T. Moroni
;
S. T. Moroni
5Tyndall National Institute,
University College Cork
, Ireland
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E. Pelucchi
;
E. Pelucchi
5Tyndall National Institute,
University College Cork
, Ireland
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D. Barettin;
D. Barettin
6
“Università Niccolo Cusano” 00133 and University of Rome “Tor Vergata” 00166
, Italy, Rome
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S. Rouvimov;
S. Rouvimov
1Ioffe Physico-Technical Institute,
Russian Academy of Sciences
, Saint Petersburg 194021, Russia
3Electrical Engineering,
University of Notre Dame
, Notre Dame, Indiana 46556, USA
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A. M. Mintairov
A. M. Mintairov
1Ioffe Physico-Technical Institute,
Russian Academy of Sciences
, Saint Petersburg 194021, Russia
3Electrical Engineering,
University of Notre Dame
, Notre Dame, Indiana 46556, USA
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D. V. Lebedev
1
M. M. Kulagina
1
S. I. Troshkov
1
A. S. Vlasov
1
V. Y. Davydov
1
A. N. Smirnov
1
A. A. Bogdanov
2
J. L. Merz
3
J. Kapaldo
4
A. Gocalinska
5
G. Juska
5
S. T. Moroni
5
E. Pelucchi
5
D. Barettin
6
S. Rouvimov
1,3
A. M. Mintairov
1,3
1Ioffe Physico-Technical Institute,
Russian Academy of Sciences
, Saint Petersburg 194021, Russia
2
ITMO University
, Saint Petersburg 199034, Russia
3Electrical Engineering,
University of Notre Dame
, Notre Dame, Indiana 46556, USA
4Physics Department,
University of Notre Dame
, Notre Dame, Indiana 46556, USA
5Tyndall National Institute,
University College Cork
, Ireland
6
“Università Niccolo Cusano” 00133 and University of Rome “Tor Vergata” 00166
, Italy, Rome
Appl. Phys. Lett. 110, 121101 (2017)
Article history
Received:
November 24 2016
Accepted:
March 02 2017
Citation
D. V. Lebedev, M. M. Kulagina, S. I. Troshkov, A. S. Vlasov, V. Y. Davydov, A. N. Smirnov, A. A. Bogdanov, J. L. Merz, J. Kapaldo, A. Gocalinska, G. Juska, S. T. Moroni, E. Pelucchi, D. Barettin, S. Rouvimov, A. M. Mintairov; Excitonic lasing of strain-free InP(As) quantum dots in AlInAs microdisk. Appl. Phys. Lett. 20 March 2017; 110 (12): 121101. https://doi.org/10.1063/1.4979029
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