We report on low operating voltage thin-film transistors (TFTs) and integrated inverters based on copper(I) thiocyanate (CuSCN) layers processed from solution at low temperature on free-standing plastic foils. As-fabricated coplanar bottom-gate and staggered top-gate TFTs exhibit hole-transporting characteristics with average mobility values of 0.0016 cm2 V−1 s−1 and 0.013 cm2 V−1 s−1, respectively, current on/off ratio in the range 102–104, and maximum operating voltages between −3.5 and −10 V, depending on the gate dielectric employed. The promising TFT characteristics enable fabrication of unipolar NOT gates on flexible free-standing plastic substrates with voltage gain of 3.4 at voltages as low as −3.5 V. Importantly, discrete CuSCN transistors and integrated logic inverters remain fully functional even when mechanically bent to a tensile radius of 4 mm, demonstrating the potential of the technology for flexible electronics.
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13 March 2017
Research Article|
March 17 2017
Solution-processed p-type copper(I) thiocyanate (CuSCN) for low-voltage flexible thin-film transistors and integrated inverter circuits
Luisa Petti;
Luisa Petti
1Department of Physics and Centre for Plastic Electronics, Blackett Laboratory,
Imperial College London
, London SW7 2AZ, United Kingdom
2Electronics Laboratory,
Swiss Federal Institute of Technology Zurich
, Gloriastrasse 35, 8092 Zurich, Switzerland
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Pichaya Pattanasattayavong
;
Pichaya Pattanasattayavong
3Department of Materials Science and Engineering, School of Molecular Science and Engineering,
Vidyasirimedhi Institute of Science and Technology (VISTEC)
, Rayong 21210, Thailand
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Yen-Hung Lin;
Yen-Hung Lin
1Department of Physics and Centre for Plastic Electronics, Blackett Laboratory,
Imperial College London
, London SW7 2AZ, United Kingdom
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Niko Münzenrieder
;
Niko Münzenrieder
2Electronics Laboratory,
Swiss Federal Institute of Technology Zurich
, Gloriastrasse 35, 8092 Zurich, Switzerland
4Sensor Technology Research Center, School of Engineering and Informatics,
University of Sussex
, Falmer, Brighton BN1 9RH, United Kingdom
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Giuseppe Cantarella;
Giuseppe Cantarella
2Electronics Laboratory,
Swiss Federal Institute of Technology Zurich
, Gloriastrasse 35, 8092 Zurich, Switzerland
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Nir Yaacobi-Gross;
Nir Yaacobi-Gross
1Department of Physics and Centre for Plastic Electronics, Blackett Laboratory,
Imperial College London
, London SW7 2AZ, United Kingdom
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Feng Yan;
Feng Yan
5Department of Applied Physics and Materials Research Centre,
The Hong Kong Polytechnic University
, Hong Kong, China
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Gerhard Tröster;
Gerhard Tröster
2Electronics Laboratory,
Swiss Federal Institute of Technology Zurich
, Gloriastrasse 35, 8092 Zurich, Switzerland
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Thomas D. Anthopoulos
Thomas D. Anthopoulos
a)
1Department of Physics and Centre for Plastic Electronics, Blackett Laboratory,
Imperial College London
, London SW7 2AZ, United Kingdom
6Materials Science and Engineering, Division of Physical Sciences and Engineering,
King Abdullah University of Science and Technology
, Thuwal 23955-6900, Saudi Arabia
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a)
Author to whom correspondence should be addressed. Electronic mail: t.anthopoulos@imperial.ac.uk
Appl. Phys. Lett. 110, 113504 (2017)
Article history
Received:
November 24 2016
Accepted:
March 01 2017
Citation
Luisa Petti, Pichaya Pattanasattayavong, Yen-Hung Lin, Niko Münzenrieder, Giuseppe Cantarella, Nir Yaacobi-Gross, Feng Yan, Gerhard Tröster, Thomas D. Anthopoulos; Solution-processed p-type copper(I) thiocyanate (CuSCN) for low-voltage flexible thin-film transistors and integrated inverter circuits. Appl. Phys. Lett. 13 March 2017; 110 (11): 113504. https://doi.org/10.1063/1.4978531
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