We study the influence of the interface quality of Pt/Y3Fe5O12(111) hybrids on their spin Hall magnetoresistance. This is achieved by exposing Y3Fe5O12(111) single crystal substrates to different well-defined surface treatments prior to the Pt deposition. The quality of the Y3Fe5O12(YIG) surface, the Pt/YIG interface and the Pt layer is monitored in-situ by reflection high-energy electron diffraction and Auger electron spectroscopy as well as ex-situ by atomic force microscopy and X-ray diffraction. To identify the impact of the different surface treatments on the spin Hall magnetoresistance, angle-dependent magnetoresistance measurements are carried out at room temperature. The largest spin Hall magnetoresistance is found in Pt/YIG fabricated by a two-step surface treatment consisting of a “piranha” etch process followed by an annealing step at 500 °C in pure oxygen atmosphere. Our data suggest that the small spin Hall magnetoresistance in Pt/YIG without any surface treatments of the YIG substrate prior to Pt deposition is caused by a considerable carbon agglomeration at the Y3Fe5O12 surface.

1.
R.
Urban
,
G.
Woltersdorf
, and
B.
Heinrich
,
Phys. Rev. Lett.
87
,
217204
(
2001
).
2.
B.
Heinrich
,
C.
Burrowes
,
E.
Montoya
,
B.
Kardasz
,
E.
Girt
,
Y.-Y.
Song
,
Y.
Sun
, and
M.
Wu
,
Phys. Rev. Lett.
107
,
066604
(
2011
).
3.
F. D.
Czeschka
,
L.
Dreher
,
M. S.
Brandt
,
M.
Weiler
,
M.
Althammer
,
I.-M.
Imort
,
G.
Reiss
,
A.
Thomas
,
W.
Schoch
,
W.
Limmer
,
H.
Huebl
,
R.
Gross
, and
S. T. B.
Goennenwein
,
Phys. Rev. Lett.
107
,
046601
(
2011
).
4.
K.-i.
Uchida
,
H.
Adachi
,
T.
Ota
,
H.
Nakayama
,
S.
Maekawa
, and
E.
Saitoh
,
Appl. Phys. Lett.
97
,
172505
(
2010
).
5.
S.
Geprägs
,
A.
Kehlberger
,
F. D.
Coletta
,
Z.
Qiu
,
E.-J.
Guo
,
T.
Schulz
,
C.
Mix
,
S.
Meyer
,
A.
Kamra
,
M.
Althammer
,
H.
Huebl
,
G.
Jakob
,
Y.
Ohnuma
,
H.
Adachi
,
J.
Barker
,
S.
Maekawa
,
G. E. W.
Bauer
,
E.
Saitoh
,
R.
Gross
,
S. T. B.
Goennenwein
, and
M.
Kläui
,
Nat. Commun.
7
,
10452
(
2016
).
6.
H.
Nakayama
,
M.
Althammer
,
Y.-T.
Chen
,
K.
Uchida
,
Y.
Kajiwara
,
D.
Kikuchi
,
T.
Ohtani
,
S.
Geprägs
,
M.
Opel
,
S.
Takahashi
,
R.
Gross
,
G. E. W.
Bauer
,
S. T. B.
Goennenwein
, and
E.
Saitoh
,
Phys. Rev. Lett.
110
,
206601
(
2013
).
7.
M.
Althammer
,
S.
Meyer
,
H.
Nakayama
,
M.
Schreier
,
S.
Altmannshofer
,
M.
Weiler
,
H.
Huebl
,
S.
Geprägs
,
M.
Opel
,
R.
Gross
,
D.
Meier
,
C.
Klewe
,
T.
Kuschel
,
J.-M.
Schmalhorst
,
G.
Reiss
,
L.
Shen
,
A.
Gupta
,
Y.-T.
Chen
,
G. E. W.
Bauer
,
E.
Saitoh
, and
S. T. B.
Goennenwein
,
Phys. Rev. B
87
,
224401
(
2013
).
8.
J. E.
Hirsch
,
Phys. Rev. Lett.
83
,
1834
(
1999
).
9.
Y.-T.
Chen
,
S.
Takahashi
,
H.
Nakayama
,
M.
Althammer
,
S. T. B.
Goennenwein
,
E.
Saitoh
, and
G. E. W.
Bauer
,
Phys. Rev. B
87
,
144411
(
2013
).
10.
A.
Brataas
,
Y. V.
Nazarov
, and
G. E. W.
Bauer
,
Phys. Rev. Lett.
84
,
2481
(
2000
).
11.
M.
Weiler
,
M.
Althammer
,
M.
Schreier
,
J.
Lotze
,
M.
Pernpeintner
,
S.
Meyer
,
H.
Huebl
,
R.
Gross
,
A.
Kamra
,
J.
Xiao
,
Y.-T.
Chen
,
H.
Jiao
,
G. E. W.
Bauer
, and
S. T. B.
Goennenwein
,
Phys. Rev. Lett.
111
,
176601
(
2013
).
12.
C.
Burrowes
,
B.
Heinrich
,
B.
Kardasz
,
E. A.
Montoya
,
E.
Girt
,
Y.
Sun
,
Y.-Y.
Song
, and
M.
Wu
,
Appl. Phys. Lett.
100
,
092403
(
2012
).
13.
M. B.
Jungfleisch
,
V.
Lauer
,
R.
Neb
,
A. V.
Chumak
, and
B.
Hillebrands
,
Appl. Phys. Lett.
103
,
022411
(
2013
).
14.
Z.
Qiu
,
K.
Ando
,
K.
Uchida
,
Y.
Kajiwara
,
R.
Takahashi
,
H.
Nakayama
,
T.
An
,
Y.
Fujikawa
, and
E.
Saitoh
,
Appl. Phys. Lett.
103
,
092404
(
2013
).
15.
Z.
Qiu
,
D.
Hou
,
K.
Uchida
, and
E.
Saitoh
,
J. Phys. D: Appl. Phys.
48
,
164013
(
2015
).
16.
M.
Lambacher
,
T.
Helm
,
M.
Kartsovnik
, and
A.
Erb
,
Eur. Phys. J. Spec. Top.
188
,
61
(
2010
).
17.
For the piranha acid we used concentrated sulfuric acid (H2SO4, 98%) and hydrogen peroxide solution (H2O2, 30%) in the ratio 1:1, by volume.
18.
P. W.
Palmberg
,
J. Vac. Sci. Technol.
13
,
214
(
1976
).
19.
C. J.
Powell
and
M. P.
Seah
,
J. Vac. Sci. Technol. A
8
,
735
(
1990
).
20.
Handbook of Auger Electron Spectroscopy
, edited by
L. E.
Davis
,
N. C.
MacDonald
,
P. W.
Palmberg
,
G. E.
Riach
, and
R. E.
Weber
, 2nd ed. (
Physical Electronics Division, Perkin-Elmer Corporation
,
Eden Prairie, MN
,
1978
).
21.
J. I.
Langford
and
A. J. C.
Wilson
,
J. Appl. Crystallogr.
11
,
102
(
1978
).
22.
M.
Hiratani
,
T.
Nabatame
,
Y.
Matsui
, and
S.
Kimura
,
Thin Solid Films
410
,
200
(
2002
).
23.
K. A.
Telari
,
B. R.
Rogers
,
H.
Fang
,
L.
Shen
,
R. A.
Weller
, and
D. N.
Braski
,
J. Vac. Sci. Technol. B
20
,
590
(
2002
).
24.
G. A.
Battiston
,
R.
Gerbasi
, and
A.
Rodriguez
,
Chem. Vap. Deposition
11
,
130
(
2005
).
25.
B.
Gao
,
M.
Rudneva
,
K. S.
McGarrity
,
Q.
Xu
,
F.
Prins
,
J. M.
Thijssen
,
H.
Zandbergen
, and
H. S. J.
van der Zant
,
Nanotechnology
22
,
205705
(
2011
).
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