We report on a flow sensing approach based on deflection monitoring of a micro beam buckled by the compressive thermal stress due to electrothermal Joule's heating. The air stream, convectively cooling the device, affects both the critical buckling values of the electric current and the postbuckling deflections of the structure. After calibration, the flow velocity can be obtained from the deflection measurements. The quasi-static responses of 1000 μm and 2000 μm long, 10 μm wide, and 30 μm high single crystal silicon beams were consistent with the prediction of the model, which couples thermoelectric, thermofluidic, and structural domains. The deflection sensitivity of up to 1.5 μm/(m/s) and the critical current sensitivity of up to 0.43 mA/(m/s) were registered in the experiments. Our model and experimental results demonstrate the feasibility of the sensing approach and further suggest that simple, robust, and potentially downscalable beam-type devices may have use in flow velocity and wall shear stress sensors.
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22 August 2016
Research Article|
August 25 2016
Flow sensing by buckling monitoring of electrothermally actuated double-clamped micro beams Available to Purchase
Y. Kessler;
Y. Kessler
School of Mechanical Engineering,
Tel Aviv University
, Tel Aviv 69978, Israel
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S. Krylov;
S. Krylov
School of Mechanical Engineering,
Tel Aviv University
, Tel Aviv 69978, Israel
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A. Liberzon
A. Liberzon
School of Mechanical Engineering,
Tel Aviv University
, Tel Aviv 69978, Israel
Search for other works by this author on:
Y. Kessler
School of Mechanical Engineering,
Tel Aviv University
, Tel Aviv 69978, Israel
S. Krylov
School of Mechanical Engineering,
Tel Aviv University
, Tel Aviv 69978, Israel
A. Liberzon
School of Mechanical Engineering,
Tel Aviv University
, Tel Aviv 69978, Israel
Appl. Phys. Lett. 109, 083503 (2016)
Article history
Received:
May 16 2016
Accepted:
August 12 2016
Citation
Y. Kessler, S. Krylov, A. Liberzon; Flow sensing by buckling monitoring of electrothermally actuated double-clamped micro beams. Appl. Phys. Lett. 22 August 2016; 109 (8): 083503. https://doi.org/10.1063/1.4961582
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